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Design for Testability Design for Testability

Design for Testability - PowerPoint Presentation

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Uploaded On 2016-05-21

Design for Testability - PPT Presentation

By Dr Amin Danial Asham References An Introduction to Logic Circuit Testing 3 LEVELSENSITIVE SCAN DESIGN LSSD The levelsensitive aspect of the method means that a sequential circuit is designed so that the steadystate response to any input ID: 328689

clock scan design latch scan clock latch design circuit cont partial flip lssd flops system level sensitive input latches

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