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Sohail Musa Mahmood Sohail Musa Mahmood

Sohail Musa Mahmood - PowerPoint Presentation

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Sohail Musa Mahmood - PPT Presentation

on behalf of SAMPA team and Norwegian group SAMPA linearity test results SAMPAmeeting 11032015 Gain and Peaking time Setup configuration Connecting a small ID: 172567

linearity 160 20mv 30mv 160 linearity 30mv 20mv linearitymean neg pos channels results gain tests inl chip input setup

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Presentation Transcript

Slide1

Sohail Musa Mahmoodon behalf of SAMPA team and Norwegian group

SAMPA linearity test results

SAMPAmeeting

11.03.2015Slide2

Gain and Peaking timeSetup configuration

Connecting a small capacitance in series with the input

cable

.

Applying

an input signal (square wave, ramp up/down, exponential rise/fall ).

Connecting

the

input signal

directly

to

the

detector

pads

.

Setting

the

configuration

of

the

analog chip.

Observe

the

differential

output at

the

corresponding

channel

. Slide3

Setup configurationSlide4

Gain ResultsSlide5

Gain ResultsSlide6

30mV/fC@160 ns - LinearitySlide7

20mV/fC@160 ns - LinearitySlide8

30mV/fC@160 ns (pos) – Linearity – all channelsSlide9

30mV/fC@160 ns (pos) – Linearity – mean valueSlide10

30mV/fC@160 ns (pos)- Linearity INLSlide11

30mV/fC@160 ns (neg) – Linearity All

channelsSlide12

30mV/fC@160 ns – LinearityINL – ALL CHANNELSSlide13

30mV/fC@160 ns (neg) – LinearityMEANSlide14

30mV/fC@160 ns (neg) – LinearityMEAN - INLSlide15

20mV/fC@160 ns (pos) – LinearityALL channelsSlide16

20mV/fC@160 ns (pos) – LinearityMEANSlide17

20mV/fC@160 ns (pos) – LinearityMEAN - INLSlide18

20mV/fC@160 ns (neg) – LinearityALL channelsSlide19

20mV/fC@160 ns (neg) – LinearityMEANSlide20

20mV/fC@160 ns (neg) – LinearityMEAN - INLSlide21

ConclusionLinearity seems to be good

.Some issues with the desired

gain

.

More

o

scillations

on

channel

1

than

other

channels

. (

tested

2 chips)

Some

more

linearity

results

for

the

chip 3 analog part (

only

for positive

configurations

)Slide22

On going work and future plansAnalysing

the results for statistical linearity measurements.

Preparing

the

setup

for first

irradition

tests

of

SAMPA MPW1.

Single-

Event

Latchup

tests

on

all

3 chips and Single

Event

Upset

tests

on

shift

registers (chip 3

).

Planning to

perform

the

first

irradiation

tests in

the

end

of

april in Uppsala (

together

with

RCU2 testing).Slide23

Thank you for your attention.Any questions ?