DEPTH PROFILES IN METALLIC SAMPLES Paper Number FIPP336 Elina Pajuste a b Gunta Kizane a Ieva Igaune a a Institute of Chemical Physics University of Latvia ID: 780345
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NOVEL METHOD FOR DETERMINATION OF TRITIUM DEPTH PROFILES IN METALLIC SAMPLES
Paper NumberFIP/P3-36
Elina Pajustea,b*, Gunta Kizanea, Ieva Igaunea
a Institute of Chemical Physics, University of Latvia, bFaculty of Chemistry, University of Latvia,
*Corresponding author: elina.pajuste@lu.lv
Novel method for determining the depth profile of tritium in metallic samples has been demonstrated.Results on tritium profile in neutron irradiated, plasma exposed and tritium gas loaded beryllium have been reported and possible applications of the method for other metallic samples have been tested within this research
Tritium depth profile in beryllium sample from plasma facing
wall of the vacuum vessel of Joint European Torus retrieved after ITER-Like-Wall project 1st campaign in 2012
Method is based on the simultaneous etching of the metal surface and released tritium measurements. Successful application of the proposed method has been already demonstrated for various beryllium materials and currently technique for other metallic samples are being developed. For tungsten materials etching is performed electrochemically and removed layer calculated similarly to the beryllium by the amount of evolved hydrogen.
Experimental set –up
During sample etching evolved hydrogen and released tritium is being carried by
Ar
flux to measuring detectors