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Lecture 10. Lecture 10.

Lecture 10. - PowerPoint Presentation

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Uploaded On 2016-02-27

Lecture 10. - PPT Presentation

AFM Introduction highresolution type of scanning probe microscopy with demonstrated resolution of fractions of a nanometer more than 1000 times better than the optical diffraction limit How It Works ID: 233652

frequency tip surface forces tip frequency forces surface cantilever sample mode afm oscillation force resonance amplitude contact deflection static

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