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High  Brightness Electron Source Development High  Brightness Electron Source Development

High Brightness Electron Source Development - PowerPoint Presentation

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Uploaded On 2018-11-08

High Brightness Electron Source Development - PPT Presentation

Brightness Limiting Phenomena Simulated bunch profile for 20pC and 80pC bunch charges from a realistic birefringent pulsestacked laser profile The onset of the virtual cathode instability VCI ID: 721524

brightness gun emittance photocathode gun brightness photocathode emittance development vacuum profile pulse cathode measurement bunch connection gap laser alkali

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Slide1

High Brightness Electron Source Development

Brightness Limiting Phenomena

Simulated bunch profile for 20pC and 80pC bunch charges from a realistic

birefringent

pulse-stacked laser profile. The onset of the virtual cathode instability (VCI) is apparent in the bunch lengthening and breakup.

MK II DC Gun: Pushing brightness limits

A new

DC

photogun

is under construction @ Cornell. It will feature:A segmented, shielded HV ceramic to reach higher voltage regimes. Adjustable cathode-anode gap, to allow precision control of the photocathode field, on which the onset of the VCI depends.A genetically optimized electrode profile to provide highest brightness, subject to empirical breakdown voltage constraints.

A 6-D phase space measurement beamline, transverse emittance measurement, and ps-resolution deflecting cavity.

Achieving Optimal Brightness

Genetically

optimized 3D laser pulse profile

to minimize space charge induced

emittance growth.

The MK II Gun will employ adaptive 3D laser pulse shaping to allow online optimization of emittance.Temporal shaping via birefringent crystal stackingTransverse – via truncated GaussianGood light transmission, < 20% emittance change from the optimum

Photocathode development

Gun development

CsK2Sb photocathode development

Sub-thermal

emittance

from

GaAs

cathodes

I.V.

Bazarov

, L.

Cultrera

, S. Karkare,

J. Maxson (for the ERL

injector team

)Presented at DOE Contractors’ Mtg, Annapolis, MD, August 22-23, 2011

Multi-Alkali Cathode Prep-chamber with vacuum suitcase

20mA, 8hr run

Crater Light gray

~1.5 mm diameter

Brown colored area

~4 mm diameter

Photocathode film

~0.5

mm

gap

Damage on Si substrate after 20mA run

SEM image of central damaged area

Photocathode Diagnostics

DIAGNOSTIC TECHNIQUES

A

uger Spectroscopy

LEED

Photoreflectance

Electron Energy Analyzers

Response time measurements

Work function measurement

XRF

….

PREPARATION CHAMBERS

GaAs

(

Cs,F

)

Alkali-Antimonide

ERL INJECTOR

DC GUN

In Vacuum Connection

In Vacuum Connection

In Vacuum Connection

In progress…

Supported by DOE DE-SC0003965, NSF DMR-0807731

Use of Genetic Algorithms to optimize gun geometry

Varying Pierce angle (0 to 45

)

Varying gap (2 to 12 cm)