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High image quality is crucial for reliable industrial quality assuranc High image quality is crucial for reliable industrial quality assuranc

High image quality is crucial for reliable industrial quality assuranc - PDF document

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High image quality is crucial for reliable industrial quality assuranc - PPT Presentation

Camera Specix00660069cationsCustomer specix00660069cTriggeringExternal Trigger Software Trigger Free running CAWO OG2OG8OG16Customer specix00660069c Ambient Electrical Specix00660069 ID: 820665

image x00660069 high speci x00660069 image speci high quality fraunhofer applications imaging radiation iis area running resolution xeye camera

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High image quality is crucial for reliab
High image quality is crucial for reliable industrial quality assurance and detection of even the smallest of defect areas. The X-ray camera XEye developed at the Fraunhofer IIS features without any loss of image quality. This is achieved through complete

protection of all electronic components
protection of all electronic components from damaging radiation. XEye combines high resolution and a large imaging area – the modular construction even allows the imaging area to be increased almost arbitrarily.introduced to many applications. Especia

lly industrial applications running 24/7
lly industrial applications running 24/7 bene�t from XEye´s constant image quality and High resolution computed tomographyCamera Speci�cationsCustomer speci�cTriggeringExternal Trigger, Software Trigger, Free running C

AWO OG2/OG8/OG16Customer speci񦀆
AWO OG2/OG8/OG16Customer speci�cAmbient Electrical Speci�cationsInput VoltageOutput VoltageTriggering, ServiceMechanical Speci�cationsWeightapprox. 60 kgapprox. 100 kgresistance through an optical projection of a scintill

ator screen modules. The partial images
ator screen modules. The partial images are electronically merged into a single image. This approach has Long term stability through full radiation protectionVery high image qualityMovement of the object immediately before and after Arbitrary imaging area

dimensions through modular conFETProf.
dimensions through modular conFETProf. Dr.-Ing. Albert HeubergerAm Wolfsmantel 33Contactless Test and Measuring rolf.behrendt@iis.fraunhofer.deAm Wolfsmantel 33www.iis.fraunhofer.de05/2012 K. BrohasgaFRAUNHOF INTE – RADIATION PD AY AL APPLICATION