PPT-Neighbor-Cell Assisted Error Correction for MLC NAND Flash

Author : marina-yarberry | Published Date : 2017-03-16

SIGMETRICS 14 Summary Problem as PE cycle increases raw BER significantly increases beyond the fixed ECC capability Goal this paper tries to extend lifetime by

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Neighbor-Cell Assisted Error Correction for MLC NAND Flash: Transcript

SIGMETRICS 14 Summary Problem as PE cycle increases raw BER significantly increases beyond the fixed ECC capability Goal this paper tries to extend lifetime by reducing of bit errors in a page to the extent which ECC can fix. Goshen, NH Assisted Living You Can Trust, Peace of Mind You Deserve. When it comes to senior living facilities, don’t settle for stark living conditions or “just enough” of a professional staff for yourself or your loved one. At Horseshoe Pines, we believe respect and comfort are appropriate at any age. That’s why our senior living facility is considered by many to be the best residential care available in Sullivan County and beyond! Next-generation storage. Frank Shu. Senior Program Manager. Storage Ecosystem Technologies. Microsoft Corporation. Key Takeaways. Understand Solid State Drive . (SSD) technologies. Adopt best practices for SSD design in Windows platforms to enhance SSD performance and reliability. Contact Information. Wesley Brown. wes@planetarydb.com. Twitter @. WesBrownSQL. Blog . http://www.sqlserverio.com. Today’s Topic Covers…. NAND Flash Structure. MLC and SLC Compared. NAND Flash Read Properties. . Yaakobi. , Laura . Grupp. . Steven Swanson, Paul H. Siegel, and Jack K. Wolf. Flash Memory Summit, August 2010. University of California San Diego. Efficient Coding Schemes for Flash Memories. Outline. FLASH. Yaakov (J) Stein. Types of Memory. By memory we mean any device that stores bits of information. Volatile memory. requires voltage (. and perhaps refresh. ) to maintained information. most frequently used for RAM. of A . 45nm SLC 3D NAND Flash . CPLD. Arijit Banerjee and Sergiu Mosanu. Date: 5/15/2015. Device scaling has reached molecular dimensions. 2D Moore’s law is about to end. 3D can be an option to further device scaling. Yu . Cai. , . Yixin. Luo, . Saugata. . Ghose. , Erich . F. . Haratsch. *. , Ken Mai, . Onur. . Mutlu. Carnegie . Mellon University, . *Seagate Technology. Daeyeon. . Son. 2015.10.27. Introduction. (and Security) Issues of DRAM and NAND Flash Scaling. Onur Mutlu. omutlu@gmail.com. http://users.ece.cmu.edu/~omutlu. /. HPCA Memory . R. eliability Workshop. March 13, 2016. Limits of Charge Memory. Memory: Characterization. , Optimization, and . Recovery. Yixin Luo. yixinluo@cmu.edu. (joint work with Yu Cai, . Erich . F. Haratsch, Ken Mai, Onur Mutlu). 1. Presented in the best paper session at HPCA 2015. Exploiting Self-Recovery and Temperature Awareness. Yixin Luo. Saugata Ghose Yu Cai Erich F. Haratsch Onur Mutlu. HeatWatch. Storage Technology Drivers - 2018. 2. Store . large amounts . Memory: Characterization. , Optimization, and . Recovery. Yu Cai, . Yixin Luo. , . Erich . F. . Haratsch*,. Ken . Mai, Onur . Mutlu. Carnegie Mellon University, *LSI Corporation. 1. You Probably Know. Thesis Oral. Yixin Luo. Committee:. Onur Mutlu (Chair) . Phillip B. Gibbons. James C. Hoe. Erich F. Haratsch, Seagate. Yu Cai, SK Hynix. Presented in partial fulfilment of the requirements for the degree of Doctor of Philosophy. Characterization, Mitigation, and Recovery. Yu . Cai. , . Yixin Luo. , Saugata Ghose, . Erich F. . Haratsch. *, Ken Mai, Onur Mutlu. Carnegie Mellon University, *Seagate Technology. Executive Summary. Jim Cooke. Director of Applications Engineering. Memory Products Group. Micron Technology, Inc.. Agenda . Mass Storage . HDD, HHD, SSD. How Flash can Benefit Drives. Hybrid, . ReadyBoost. , Robson, SSD.

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