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1 Memory Controller Innovations
1 Memory Controller Innovations
by eatfuzzy
for . High-Performance Systems. Rajeev . Balasubra...
Resilient Die-stacked DRAM Caches
Resilient Die-stacked DRAM Caches
by celsa-spraggs
Jaewoong. . Sim. *, Gabriel H. Loh. +. , Vilas S...
Read Disturb Errors in MLC NAND Flash Memory:
Read Disturb Errors in MLC NAND Flash Memory:
by min-jolicoeur
Characterization, Mitigation, and Recovery. Yu . ...
Enabling Technologies for Memory
Enabling Technologies for Memory
by test
Compression. : Metadata, Mapping and Prediction. ...
F AULT
F AULT
by mitsue-stanley
S. IM. : A Fast,. Configurable . Memory-Reliabil...
Handling Resistance Drift in Phase Change Memory - Device,
Handling Resistance Drift in Phase Change Memory - Device,
by faustina-dinatale
Manu Awasthi⁺. , . Manjunath. . Shevgoor. ⁺,...
ArchShield
ArchShield
by luanne-stotts
: Architectural Framework for Assisting DRAM Scal...
Error Correcting Memory
Error Correcting Memory
by lois-ondreau
EECS 373. Jon Beaumont. Ben Mason. . What is ECC...
Read Disturb Errors
Read Disturb Errors
by kittie-lecroy
in MLC NAND Flash Memory:. Characterization, Miti...
Leveraging Heterogeneity in DRAM Main Memories to Accelerat
Leveraging Heterogeneity in DRAM Main Memories to Accelerat
by tawny-fly
Niladrish. . Chatterjee. Manjunath. . Shevgoor....
ArchShield
ArchShield
by calandra-battersby
: Architectural Framework for Assisting DRAM Scal...
VOCL-FT: Introducing Techniques for Efficient Soft Error Co
VOCL-FT: Introducing Techniques for Efficient Soft Error Co
by cheryl-pisano
Antonio J. Peña, . Wesley Bland. , . Pavan. . B...
Citadel: Efficiently Protecting Stacked Memory From Large G
Citadel: Efficiently Protecting Stacked Memory From Large G
by briana-ranney
June 14. th. 2014. Prashant J. Nair - Georgia Te...
Improving the Reliability of
Improving the Reliability of
by luanne-stotts
Chip-Off Forensic Analysis. of NAND Flash Memory ...
Handling Resistance Drift in Phase Change Memory - Device, Circuit, Architecture, and System Soluti
Handling Resistance Drift in Phase Change Memory - Device, Circuit, Architecture, and System Soluti
by faustina-dinatale
Manu Awasthi⁺. , . Manjunath. . Shevgoor. ⁺,...
Read Disturb Errors
Read Disturb Errors
by min-jolicoeur
Read Disturb Errors in MLC NAND Flash Memory: Ch...
Magnetic Resonance Center and
Magnetic Resonance Center and
by AdventurousAce
Department of Chemistry. University of Florence. r...
External scrubber implementation for the ALICE ITS Readout Unit
External scrubber implementation for the ALICE ITS Readout Unit
by elina
Magnus Rentsch Ersdal. magnus.ersdal@uib.no. TWEPP...
Jcooke @ Micron.com Flash Memory Technology Direction
Jcooke @ Micron.com Flash Memory Technology Direction
by mary
Jim Cooke. Director of Applications Engineering. M...