/
Semiconductor Test Laboratory Improvements for High Tempera Semiconductor Test Laboratory Improvements for High Tempera

Semiconductor Test Laboratory Improvements for High Tempera - PowerPoint Presentation

calandra-battersby
calandra-battersby . @calandra-battersby
Follow
387 views
Uploaded On 2016-03-12

Semiconductor Test Laboratory Improvements for High Tempera - PPT Presentation

Group 2 Jomah Fangonilo Shawn Hughes Shawn Sickel Antony Stabile Dr Vikram Kapoor Dr Kalpathy Sundaram High Temperature Semiconductor Testing System Jomah Fangonilo Specifically to add additional testing capabilities to the existing lab setup ID: 253202

temperature high ghz testing high temperature testing ghz data system circuit device controller power frequency temperatures 300k voltage compressor

Share:

Link:

Embed:

Download Presentation from below link

Download Presentation The PPT/PDF document "Semiconductor Test Laboratory Improvemen..." is the property of its rightful owner. Permission is granted to download and print the materials on this web site for personal, non-commercial use only, and to display it on your personal computer provided you do not modify the materials and that you retain all copyright notices contained in the materials. By downloading content from our website, you accept the terms of this agreement.


Presentation Transcript

Slide1

Semiconductor Test Laboratory Improvements for High Temperature, Low Temperature, and High Frequency with Electronically Switchable Load

Group 2Jomah FangoniloShawn HughesShawn SickelAntony Stabile

Dr.

Vikram

Kapoor

Dr.

Kalpathy

SundaramSlide2

High Temperature Semiconductor Testing System

Jomah FangoniloSlide3

Specifically – to add additional testing capabilities to the existing lab setup

Current setup only allows for tests under room temperatureIn general – many applications exist in the fields of environmental testing, performance improvement, failure analysisMotivationSlide4

To implement a user-friendly high temperature test system similar to the existing room temperature system.

Main RequirementsCapable of testing devices up to 250° CAccuracy of ±1.5° CDerived RequirementsPowered by 120 VAC 50/60 HzController output ≤ 5ASurface measurements ≤ 1.5” x 1.5”

Objectives and RequirementsSlide5

System Block DiagramSlide6

Chromalox

A-10 Disc Heater

Outside Diameter

Inside Diameter

Thickness

Volts

Watts

Watts per Sq. In.

Approx. Net Wt.

3"

0.875"

0.25"

120

300

18

0.3 lb

1.5” x 1.5”)Slide7

100-240 VAC

5A load max3-wire Pt100 RTD or ThermocouplePID controlRamp/SoakFree softwareRS485

28,400 baud max

Cost efficient

CN7533 Controller (

Relay)Slide8
Slide9
Slide10

Speco RS232 to RS485 Converter

DB9 female connector for RS232 to two wire Terminal Block for RS485 Auto switching baud rate, speed up to 115,200 baud over a distance of 3,900 ft.Two wire, different signals, half duplex Passive operationUnits connected together in RS-485

multidrop

operation

RoHS

compliant.

$30.80Slide11

100 Ohm Thin Film DIN Platinum Class “B” (±0.12 Ohms, ±0.30°C at 0°C) Accuracy Standard

±1.5° C at 250°Silicone Adhesive rated to 260°C (500°F)Temperature Range; -73C to 260°C Continuous, 290°C (554°F) Short Term Operation When Installed with OMEGABOND Air Set CementsSold in Convenient 3-Packs ($95)Relatively low cost compared to other RTD and thermocouple options

Omega SA1-RTD-B Slide12

Test Results

High Temperature Test Results

300 µA

200 µA

100 µA

0 µA

0 V

1 V

2 V

3 V

4 V

5 V

25° C

50° C

100° C

150° C

200° CSlide13

Chromalox

A-10 Disc Heater

$0

CN7533 Controller

$97

CN7533 Controller Software

$0

Speco

RS232 to RS485 Converter

$30.80

Omega SA1-RTD-B (3-pack)

$95

Male-Male BNC Connectors

$9.55

Miscellaeous

(Wires, terminals,

etc

)

$10 Total$242 BudgetSlide14

Cryogenic Testing System

Sean HughesSlide15

Two different theories of when this temperature reached.Most scientists agree that when scale refrigeration ends, cryogenic temperatures begin, which happen at -240 °F ( -150

°C or 123 K)The National Institute of Standards and Technology at Boulder, Colorado have chosen this point to occur at -180 °C (93.15 K) because the boiling point of gases (such as He, H, O, N) lie below 93 K and Freon refrigerants have a boiling point above 93 K.

What Temperature is Considered Cryogenic?Slide16

Industries often tests devices at Extreme Temperatures

Largely due to environmental conditionsElectronics operate at increased rates at low temperaturesMOSFETsIncreased gain and speed at lower input voltagesLess Current LeakageSemiconductors Characteristics Change at Extreme LowsFreeze-Out – Silicon in the MOSFET begins to break down and there will no longer be a connection between the gate and the other components of the device and can happen at 80K

Reason for Testing at Low TemperaturesSlide17

CTI-Model 22 Refrigerator with Janis Research Co. Cold HeadCTI-Cryogenic 8001 Controller and 8300 Compressor

Polyscience 6706 Recirculating ChillerGE Vacuum PumpTemperature ControllerMain Components of Cryogenic Test SystemSlide18

CTI-Model 22 Refrigerator or

Cold HeadCold Head – Houses Semiconductor device, or any other packaged device being tested. Provides a environment capable of temperatures between

10K

– 20K.

Device is wired to the platform via copper probes to connect to external testing equipment.

4145B

Semicond

. Parameter Analyzer

4142A Impedance Analyzer

577 Curve TracerSlide19

8001 Controller / 8300 Compressor

The 8001 Controller basically acts as a power supply, providing 208V/220V, 30A, 1-Phase to the 8300 Compressor and the Cold Head. NEMA: L6-15R electrical supply.

The 8300 Compressor provides 99.999% pure compressed Helium

Helium is mixed with oil to raise its specific heat during compression

Oil impurities are filtered from High pressure helium

Pure helium is delivered to the Cold Head, then returns to the compressor

During the process of compressing helium, heat is generated which is removed by cooling water from ChillerSlide20

PS 6705 Recirculating Chiller

2 gallon capacity cooling water (tap)

Cooling water cycles through the 8300 Compressor, dissipating excess heat

Water into compressor: ~70°F

Water out: ~80°F

~1.67kW of energy removed

Accomplished by fans passing air over aluminum fins.

208/220V 20A, 1-phase NEMA:6-30PSlide21

Aluminum Doped Zinc Oxide [

ZnO:Al

]

Tested resistivity at temperatures ranging from ~300K down to 60K, samples proved to have poor thermal stability

at low temperatures

Temperature (K)

Mega

Ohms (M

Ω

)

300

3.906

200

15.944

130

26.971

117

30.010

10040.72160119.557<60ErrorSlide22

High Thermal Stability Maintained resistance when testing samples from 300K down to 20K

Resistance ranged from 54.211Ω at 300K to 57.747 Ω at 20KIndium Tin Oxide (ITO)Slide23

General JFET (2N7000)

2N7000 is an N-Channel enhancement mode FET

Testing at low temperatures show an improvement in performance.

Vgs

stepped from 3V to 10V

Room Temperature 300K

Low Temperature 80KSlide24

N-Channel MOSFET

Increase in Drain Current with the same Gate Voltage applied, leading to an increase in

transconductance

from 300K (pictured left) to 50K (pictured right)

Room Temperature 300K

Low Temperature 50KSlide25

High Frequency Testing System

Shawn SickelSlide26

Goals:Complete interface to Data

Acquisition SystemExport the data in a compatible format for further analysis in Advanced Design Systems (ADS)Specification:Read High Frequency Response within the range of 130 MHz to 18 GHzSlide27

HP 8720B Vector Network AnalyzerSlide28

Block diagramSlide29

Specifications of VNA

20+ years oldRF range of 130 MHz to 20 GHzIncident power level from -10 to -65 dBmDynamic range of 85 dBNeeds to be calibrated before each useSlide30

RF Devices

Power Splitter / Combiner

High

Pass

Filter

Microwave Transistor AmplifierSlide31

S-Parameters

Definition: The characteristics of the electrical behavior of a device or change in medium

Used to find the relationship between incident and reflected power waves, and the distribution or splitting of power

Important for device operation

 Slide32

Analysis

Logarithmic MagnitudePhaseTime DelaySmith ChartPolarLinear MagnitudeRealSWRSlide33

Interface hardware/software

Hardware: Agilent GPIB/USB InterfaceSoftware: Agilent I/O Suite 15.0Slide34

Data Acquisition Software

Developed from scratch in visual basicUsed to operate the instrument as well as gather dataSlide35

Calibration Menu and OptionsSlide36

Calibration Menu ContinuedSlide37

Acquire Data MenuSlide38

Acquire Data Menu ContinuedSlide39

Power Splitter Results

From Device Datasheet:

1 GHz -6.03 dB

2 GHz -5.95 dB

3 GHz -6.12 dB

From Acquired Data:

1 GHz -6.104 dB

2 GHz -6.311 dB

3 GHz -6.406 dBSlide40

ADS Analysis

Using exported .s2p file

DatasheetSlide41

Microwave Transistor Amplifier Results

Data from UCF RF & Antennas Lab:S211 GHz 17.125 dB

From Acquired Data:

S21

1 GHz 17.172 dBSlide42

Microwave Transistor Amplifier Results ContinuedSlide43

Importance

UCF’s High Frequency Testing labs require approval and Graduate Student Assistant accompanimentSlide44

Electronically Switchable Load

Antony StabileSlide45

Must be portably poweredAssembled on a printed circuit board

Must contain a load indicatorStable switchable interfaceMinimal CostDesign GoalsSlide46

Must switch between at least four loads50 ohm matched impedance

Cut-off frequency greater than 2 GHzCoaxial connection to connect to spectrum analyzerDesign SpecificationSlide47

Design ComponentsSlide48

CMOS switchesHigh attenuation about ~300 MHzInductive Relay

High power drawMEMS RelayNewest technology, high costDecision – Omron G6Z MEMS relayAnalog MultiplexerSlide49

Need for stabilitySwitch must be debounced

RC circuitLow qualityRC circuit with a Schmitt triggerMid-range qualityIntegrated Circuit SolutionHighest quality, high costDecision – RC circuit with Schmitt trigger

Push Button InterfaceSlide50

Modulo 4 counterDesigned with CMOS logic

State Transition CircuitSlide51

LED indicatorsSimplest designShow physical location of active

loadRequires a demux/decoderSeven Segment DisplayShows load number, which may be referencedDesigned from CMOS logicDecision – In order to minimize the size of the board, only the seven segment display will be implemented.

LED DisplaySlide52

Schematic of Seven Segment Display

Input select lines come from state transition circuit.

Output lines go to inputs of a seven segment display.Slide53

Logic Gates and Relays require 5V supplyPower Supply must be stable, since the voltage applied affects relay attenuation.

LM2575 Voltage regulatorRequires input voltage greater than 7.5VProvides steady output of 5VDecision – LM2575 Voltage regulator with 9V battery

Power SupplySlide54

Microstrips are printed directly onto the board.Used to transmit between various relays/coaxial connectors

Board must have a high dielectric strength to avoid signal attenuation.FR-4Rogers RO4003Decision – PCB with FR-4 DielectricPrinted Circuit BoardSlide55

Parts and Cost Summary

Item

Unit Price

Quantity

Cost

G6Z-1PE High-Frequency Relay

$6.15

6

$36.90

LM2575 5V Voltage Regulator

$3.26

1

$3.26

4584 Hex Schmitt Trigger

$0.71

1

$0.71

4070 Quad XOR Gate

$0.771$0.774071 Quad 2-input OR gate$0.511$0.514081 Quad 2-input AND gate$0.501$0.504013 Dual D-type flip-flop$0.511$0.51Inductor, 330 uH$1.331$1.331N5819 Shottky Barrier Rectifier$0.541$0.54SMA Female Coaxial Connectors$3.1910$31.90Seven-Segment Display$3.241$3.24PCB Pushbutton Switch$1.361$1.36

Printed Circuit Board

$33.00

1

$33.00

Total Cost:

 

$114.53