PPT-Secondary Electron

Secondary Electron D etector Ana Zehtabi Oskuie Introduction Secondary electron secondary electron detector The electron beam interaction with near surface specimen atoms will make a signal which results in the SEM image. Cornell Laboratory for Accelerator-Based Sciences and Education. LCWS11. 29 September 2011. Electron Cloud Buildup Models and Plans. EC buildup modeling over > 15 years. – broadbased collaborative effort --. Introduction to scanning electron microscopy. The aims of this course are:. ● . to introduce the principles of scanning electron microscopy. ● . to describe the components of the microscope and explain how they work. ATOMIC STRUCTURE AND INTERATOMIC BONDING. Session II. Ionic bond – . metal. + nonmetal. donates accepts. electrons electrons.  . Dissimilar electronegativities  . PRINCIPLE. . W. hen light radiations strike fluorescent material it produces flashes of light called scintillations.. . These are detected with the help of photomultiplier tube.. BLOCK DIAGRAM :. PHOTO MULTIPLIER TUBE:. PRINCIPLE. . W. hen light radiations strike fluorescent material it produces flashes of light called scintillations.. . These are detected with the help of photomultiplier tube.. BLOCK DIAGRAM :. PHOTO MULTIPLIER TUBE:. A. Pikin. Outline. Goal of the depressed electron collector development. High voltage structure of the Gatling Gun test bench. Design layout of the electron collector. Electric field distribution and analysis. Electron Microscopy Lab Introduction to scanning electron microscopy The aims of this course are: ● to introduce the principles of scanning electron microscopy ● to describe the components of the microscope and explain how they work Dmitrii Razinkov. Kristín Vilbergsdóttir. Selma Rut Sófusdóttir. The JEOL JXA-8230 electron microprobe. Mechanism of the instrument. . Electrons emitted from the electron source are accelerated at a certain accelerating voltage and collimated through electron lenses. When this electron beam hits a specimen, X-rays are generated from the specimen. By dispersing this X-ray using a dispersive element, the composition of the specimen can be examined. This type of spectrometer is called a wavelength dispersive X-ray spectrometer (WDS). Josh Yoskowitz. Description: Goals & Requirements. BED model comes from Kim and Rudd (1994) article here: . https://doi.org/10.1103/PhysRevA.50.3954. . Goals. :. Fully describe electron-atom/molecule collisions. (SEM) Electron Microscopy (SEM) and TEM Scanning electron microscopy is used for inspecting topographies of specimens at very high magnifications using a piece of equipment called the scanning electr pFig. 2 Prepacation of sutmples for SEM. The sample S tundergoes pllnetarywforion dur mg evaporat on of gold wire for the tungsten spical W.Another very convenient method for achieving the multi-angul Breakdown in Gaseous Insulation. Gaseous dielectrics in practice are not free of electrically charged particles, including free electrons. The electrons, which may be caused by irradiation or field emission, can lead to a breakdown process to be initiated. . and. Other Characterization Methods. Schedule for next 3 weeks. Week 9: Oct. 18 – Ch. 7 quiz, SEM/Characterization. . Oct. 20 – No class, SEM virtual reality lab. Week 10: Oct. 25 – Fabrication methods for nanotechnology. The aims of this course are:. ● . to introduce the principles of scanning electron microscopy. ● . to describe the components of the microscope and explain how they work. ● . to highlight some of the problems which can arise during imaging.