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F 2002EECS 579: Digital Testing1Some real defects in VLSI and PCBStuck F 2002EECS 579: Digital Testing1Some real defects in VLSI and PCBStuck

F 2002EECS 579: Digital Testing1Some real defects in VLSI and PCBStuck - PDF document

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Uploaded On 2016-03-24

F 2002EECS 579: Digital Testing1Some real defects in VLSI and PCBStuck - PPT Presentation

F 2002EECS 579 Digital Testing2IO function tests inadequate for IO function tests inadequate for IO function tests inadequate for IO function tests inadequate for Real defects often mechanical ID: 268313

2002EECS 579: Digital Testing2I/O

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