Application Development Engineer Agilent Technologies Electromagnetic Properties of Materials Characterization at Microwave Frequencies and Beyond Agenda Definitions Measurement Techniques Coaxial Probe ID: 363873
Download Presentation The PPT/PDF document "Shelley Begley" is the property of its rightful owner. Permission is granted to download and print the materials on this web site for personal, non-commercial use only, and to display it on your personal computer provided you do not modify the materials and that you retain all copyright notices contained in the materials. By downloading content from our website, you accept the terms of this agreement.
Slide1
Shelley BegleyApplication Development EngineerAgilent Technologies
Electromagnetic Properties of Materials: Characterization at Microwave Frequencies and BeyondSlide2
Agenda
Definitions
Measurement Techniques
Coaxial Probe Transmission Line Free-Space
Resonant Cavity Summary2Slide3
DefinitionsPermittivity is a physical quantity that describes how an electric field affects and is affected by a dielectric medium and is determined by the ability of a material to polarize in response to an applied electric field, and thereby to cancel, partially, the field inside the material. Permittivity relates therefore to a material's ability to transmit (or "permit") an electric field…The permittivity of a material is usually given relative to that of vacuum, as a relative permittivity, (also called dielectric constant in some cases)….- Wikipedia
Dielectric Constant?
Loss Tangent?
Permeability!
Dissipation Factor?
Permittivity!Slide4
Permittivity and Permeability Definitionsinteraction of a material in the presence of an external electric field.
Permittivity
(Dielectric Constant)Slide5
Permittivity and Permeability Definitionsinteraction of a material in the presence of an external electric field.
Permittivity
(Dielectric Constant)Slide6
Permittivity and Permeability Definitionsinteraction of a material in the presence of an external electric field.
interaction of a material in the presence of an external magnetic field.
Permittivity
(Dielectric Constant)
PermeabilitySlide7
Permittivity and Permeability Definitionsinteraction of a material in the presence of an external electric field.
interaction of a material in the presence of an external magnetic field.
Permittivity
(Dielectric Constant)
Permeability
Complex but not Constant!Slide8
Electromagnetic Field Interaction
Electric
Magnetic
Permittivity
Permeability
Fields
Fields
STORAGE
MUT
STORAGESlide9
Electromagnetic Field Interaction
Electric
Magnetic
Permittivity
Permeability
Fields
Fields
STORAGE
LOSS
MUT
STORAGE
LOSSSlide10
Loss Tangent
Dissipation Factor
Quality FactorSlide11
Relaxation Constant tt
= Time required for 1/e of an aligned system to return to equilibrium or random state, in seconds.
1
1
10
100
10
100
Water at 20
o
C
f, GHz
most energy is lost at 1/
tSlide12
Techniques
Transmission LIne
Resonant
Cavity
Free Space
Coaxial
ProbeSlide13
Which Technique is Best?
It Depends…Slide14
Frequency of interest Expected value of
er and
mr
Required measurement accuracyWhich Technique is Best?
It Depends… onSlide15
Frequency of interest Expected value of
er and
mr
Required measurement accuracy Material properties (i.e., homogeneous, isotropic) Form of material (i.e., liquid, powder, solid, sheet)
Sample size restrictionsWhich Technique is Best?
It Depends… onSlide16
Frequency of interest Expected value of
er and
mr
Required measurement accuracy Material properties (i.e., homogeneous, isotropic) Form of material (i.e., liquid, powder, solid, sheet)
Sample size restrictions Destructive or non-destructive Contacting or non-contacting Temperature
Which Technique is Best?
It Depends… onSlide17
Measurement Techniques
vs. Frequency and Material Loss
Frequency
Loss
Transmission line
Resonant Cavity
Coaxial Probe
Microwave
RF
Millimeter-wave
Low frequency
High
Medium
Low
Free Space
50 MHz
20 GHz
40 GHz
60 GHz
5 GHz
500+ GHzSlide18
Measurement Techniques
vs. Frequency and Material Loss
Frequency
Loss
Coaxial Probe
Microwave
RF
Millimeter-wave
Low frequency
High
Medium
Low
50 MHz
20 GHz
40 GHz
60 GHz
5 GHz
500+ GHzSlide19
Measurement Techniques
vs. Frequency and Material Loss
Frequency
Loss
Coaxial Probe
Microwave
RF
Millimeter-wave
Low frequency
High
Medium
Low
50 MHz
20 GHz
40 GHz
60 GHz
5 GHz
500+ GHzSlide20
Measurement Techniques
vs. Frequency and Material Loss
Frequency
Loss
Transmission line
Coaxial Probe
Microwave
RF
Millimeter-wave
Low frequency
High
Medium
Low
Free Space
50 MHz
20 GHz
40 GHz
60 GHz
5 GHz
500+ GHzSlide21
Measurement Techniques
vs. Frequency and Material Loss
Frequency
Loss
Transmission line
Coaxial Probe
Microwave
RF
Millimeter-wave
Low frequency
High
Medium
Low
Free Space
50 MHz
20 GHz
40 GHz
60 GHz
5 GHz
500+ GHzSlide22
Measurement Techniques
vs. Frequency and Material Loss
Frequency
Loss
Transmission line
Resonant Cavity
Coaxial Probe
Microwave
RF
Millimeter-wave
Low frequency
High
Medium
Low
Free Space
50 MHz
20 GHz
40 GHz
60 GHz
5 GHz
500+ GHzSlide23
Coaxial Probe System
Network Analyzer
(or E4991A Impedance Analyzer)
85070E
Dielectric Probe
GP-IB, LAN or USB
85070E Software (included in kit)
Calibration is required
Computer
(Optional for PNA or ENA-C)Slide24
Material assumptions:
effectively infinite thickness non-magnetic
isotropic
homogeneousno air gaps or bubblesCoaxial Probe
11
Reflection
(S )
e
r
Slide25
Three Probe Designs
High Temperature Probe
0.200 – 20GHz (low end 0.01GHz with impedance analyzer)
Withstands -40 to 200 degrees C
Survives corrosive chemicals
Flanged design allows measuring flat surfaced solids.Slide26
Three Probe Designs
Slim Form Probe
0.500 – 50GHz
Low cost consumable design
Fits in tight spaces, smaller sample sizes
For liquids and soft semi-solids onlySlide27
Three Probe Designs
Performance Probe
Combines rugged high temperature performance with high frequency performance, all in one slim design.
0.500 – 50GHz
Withstands -40 to 200 degrees C
Hermetically sealed on both ends, OK for autoclave
Food grade stainless steelSlide28
Coaxial Probe Example DataSlide29
Coaxial Probe Example DataSlide30
Coaxial Probe Example DataSlide31
Martini Meter!
Infometrix, Inc.Slide32
Transmission Line System
Network Analyzer
Sample holder
connected between coax cables
85071E Materials Measurement Software
Calibration is required
Computer
(Optional for PNA or ENA-C)
GP-IB, LAN or USBSlide33
Transmission Line Sample Holders
Waveguide
CoaxialSlide34
Transmission Line
l
Reflection
(S )
11
Transmission
(S )
21
Material assumptions:
sample fills fixture cross section
no air gaps at fixture walls
flat faces, perpendicular to long axis
Known thickness > 20/360
λ
e
r
and
m
r Slide35
Transmission m
odels
in the 85071E Software
Algorithm
Measured S-parameters
Output
Nicolson-Ross
S11, S21, S12, S22
ε
r
and
μ
r
NIST Precision
S11, S21, S12, S22
ε
r
Fast Transmission
S21, S12
ε
r
Poly Fit 1
S11, S21, S12, S22
ε
r
and
μ
r
Poly Fit 2
S12, S21
ε
r
Stack Two
S21, S12 (2 samples)
ε
r
and
μ
rSlide36
Reflection m
odels
in the 85071E Software
Algorithm
Measured S-parameters
Output
Short Backed
S11
ε
r
Arbitrary Backed
S11
ε
r
Single Double Thickness
S11 (2 samples)
ε
r
and
μ
r
Slide37
Transmission Example DataSlide38
Transmission Example DataSlide39
85071E Materials Measurement Software
Transmission Free-Space System
Network Analyzer
Sample holder
fixtured between two antennae
Calibration is required
Computer
(Optional for PNA or ENA-C)
GP-IB, LAN or USBSlide40
Non-Contacting method for High or Low Temperature Tests.
Free Space with FurnaceSlide41
Transmission Free-Space
Material assumptions: Flat parallel faced samples
Sample in non-reactive region
Beam spot is contained in sample Known thickness > 20/360 λ
l
Reflection
(S11 )
Transmission
(S21 )
e
r
and
m
r Slide42
Free Space Example DataSlide43
Free Space Example DataSlide44
Resonant Cavity System
Resonant Cavity with sample
connected between ports.
Network Analyzer
GP-IB or LAN
Computer
(Optional for PNA or ENA-C)
Resonant Cavity Software
No calibration requiredSlide45
Resonant Cavity Fixtures
Agilent Split Cylinder Resonator IPC TM-650-2.5.5.5.13
Split Post Dielectric Resonators from QWED
ASTM 2520 Waveguide ResonatorsSlide46
Resonant Cavity Technique
f
f
c
Q
c
empty cavity
fc = Resonant Frequency of Empty Cavity
fs = Resonant Frequency of Filled Cavity
Qc = Q of Empty Cavity
Qs = Q of Filled Cavity
Vs = Volume of Empty Cavity
Vc = Volume of Sample
ASTM 2520
S21Slide47
Resonant Cavity Technique
Q
f
s
f
f
c
s
Q
c
empty cavity
sample inserted
fc = Resonant Frequency of Empty Cavity
fs = Resonant Frequency of Filled Cavity
Qc = Q of Empty Cavity
Qs = Q of Filled Cavity
Vs = Volume of Empty Cavity
Vc = Volume of Sample
ASTM 2520
S21Slide48
Resonant Cavity Technique
Q
f
s
f
f
c
s
Q
c
empty cavity
sample inserted
fc = Resonant Frequency of Empty Cavity
fs = Resonant Frequency of Filled Cavity
Qc = Q of Empty Cavity
Qs = Q of Filled Cavity
Vs = Volume of Empty Cavity
Vc = Volume of Sample
ASTM 2520
S21Slide49
Resonant Cavity Technique
Q
f
s
f
f
c
s
Q
c
empty cavity
sample inserted
fc = Resonant Frequency of Empty Cavity
fs = Resonant Frequency of Filled Cavity
Qc = Q of Empty Cavity
Qs = Q of Filled Cavity
Vs = Volume of Empty Cavity
Vc = Volume of Sample
ASTM 2520
S21Slide50
Resonant Cavity Example DataSlide51
Resonant vs. Broadband Transmission Methods
Resonant
Broadband
Low Loss materials
Yes
e
r
” resolution ≤10
-4
No
e
r
” resolution ≥10
-2
Thin Films and Sheets
Yes
10GHz sample thickness <1mm
No
10GHz optimum thickness ~ 5-10mm
Calibration Required
No
Yes
Measurement Frequency Coverage
Single Frequency
Broadband or BandedSlide52
Materials Ordering
Convenience Specials
Model Number
Description
85071E
E19
E03
E04
E15
E07
Split Post Dielectric Resonators from QWED
1.1GHz
2.5GHz
5GHz
15GHz
22GHz
85071E
E02
E01
E22
E18
E24
Quasi-optical products from Thomas Keating Ltd.
60-90GHz – Quasi-optical Table
75-110GHz – Quasi-optical Table
90-140GHz – Additional set of horns for above tables
220-326GHz – Additional set of horns for above tables
325-500GHz – Additional set of horns for above tablesSlide53
Materials Ordering
Convenience Specials
Model Number
Description
85071E
E19
E03
E04
E15
E07
Split Post Dielectric Resonators from QWED
1.1GHz
2.5GHz
5GHz
15GHz
22GHz
85071E
E02
E01
E22
E18
E24
Quasi-optical products from Thomas Keating Ltd.
60-90GHz – Quasi-optical Table
75-110GHz – Quasi-optical Table
90-140GHz – Additional set of horns for above tables
220-326GHz – Additional set of horns for above tables
325-500GHz – Additional set of horns for above tablesSlide54
For More InformationVisit our website at:www.agilent.com/find/materials
For Product Overviews, Application Notes, Manuals, Quick Quotes, international contact information…Slide55
References
R N Clarke (Ed.), “A Guide to the Characterisation of
Dielectric Materials at RF and Microwave Frequencies,”
Published by The Institute of Measurement & Control (UK) & NPL, 2003J. Baker-Jarvis, M.D. Janezic, R.F. Riddle, R.T. Johnk, P. Kabos, C. Holloway, R.G. Geyer, C.A. Grosvenor,
“Measuring the Permittivity and Permeability of Lossy Materials: Solids, Liquids, Metals, Building Materials, and Negative-Index Materials,” NIST Technical Note 15362005“Test methods for complex permittivity (Dielectric Constant) of solid electrical insulating materials at microwave frequencies and temperatures to 1650°,
”
ASTM Standard D2520, American Society for Testing and Materials
Janezic M. and Baker-Jarvis J.,
“Full-wave Analysis of a Split-Cylinder Resonator for Nondestructive Permittivity Measurements,”
IEEE Transactions on Microwave Theory and Techniques vol. 47, no. 10, Oct 1999, pg. 2014-2020
J.
Krupka
, A.P. Gregory, O.C.
Rochard
, R.N. Clarke, B. Riddle, J. Baker-Jarvis,
“Uncertainty of Complex Permittivity Measurement by Split-Post Dielectric Resonator Techniques,”
Journal of the European Ceramic Society
No. 10, 2001, pg. 2673-2676
“Basics of
Measureing
the Dielectric Properties of Materials”. Agilent application note. 5989-2589EN AM. Nicolson and G. F. Ross, "Measurement of the intrinsic properties of materials by time domain techniques,"
IEEE Trans. Instrum. Meas., IM-19(4), pp. 377-382, 1970. Improved Technique for Determining Complex Permittivity with the Transmission/Reflection Method, James Baker-Jarvis et al, IEEE transactions on microwave Theory and Techniques
vol 38, No. 8 August 1990 P. G. Bartley, and S. B. Begley, “A New Technique for the Determination of the Complex Permittivity and Permeability of Materials Proc. IEEE Instrument Meas. Technol. Conf., pp. 54-57, 2010.