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At BurrBrown we characterize and qualify the reliability of our devices through high temperature At BurrBrown we characterize and qualify the reliability of our devices through high temperature

At BurrBrown we characterize and qualify the reliability of our devices through high temperature - PDF document

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Uploaded On 2014-12-18

At BurrBrown we characterize and qualify the reliability of our devices through high temperature - PPT Presentation

The re sults of this testing are quantified with such values as MTTF and failure rate This information can be very valuable when used for comparative purposes or applied to reliability cal culations However this information loses its worth if it is ID: 25629

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