PPT-Improving 3D NAND Flash Memory Device Reliability by

Exploiting SelfRecovery and Temperature Awareness Yixin Luo Saugata Ghose Yu Cai Erich F Haratsch Onur Mutlu HeatWatch Storage Technology Drivers 2018 2 Store large amounts . Next-generation storage. Frank Shu. Senior Program Manager. Storage Ecosystem Technologies. Microsoft Corporation. Key Takeaways. Understand Solid State Drive . (SSD) technologies. Adopt best practices for SSD design in Windows platforms to enhance SSD performance and reliability. Qing Xu. Tie Chen. Flash. An electronic device. Non-volatile. Can be electrically erased and reprogrammed. Usage:. Digital Music Device. Smartphones. Digital Cameras. Removable Storage Devices. (picpedia.com). Contact Information. Wesley Brown. wes@planetarydb.com. Twitter @. WesBrownSQL. Blog . http://www.sqlserverio.com. Today’s Topic Covers…. NAND Flash Structure. MLC and SLC Compared. NAND Flash Read Properties. Improving Lifetime with W rite - hotness A ware R etention M anagement Yixin Luo , Yu Cai , Saugata Ghose, Jongmoo Choi*, Onur Mutlu Carnegie Mellon University, * Dankook University WARM 1 Exec Embedded Systems . Chanik. Park, . Jaeyu. . Seo. , . Dongyoung. . Seo. , . Shinhan. Kim and . Bumsoo. Kim . Software Center, SAMSUNG Electronics, Co., Ltd. . Proceedings of the 21st International Conference on Computer . of A . 45nm SLC 3D NAND Flash . CPLD. Arijit Banerjee and Sergiu Mosanu. Date: 5/15/2015. Device scaling has reached molecular dimensions. 2D Moore’s law is about to end. 3D can be an option to further device scaling. (and Security) Issues of DRAM and NAND Flash Scaling. Onur Mutlu. omutlu@gmail.com. http://users.ece.cmu.edu/~omutlu. /. HPCA Memory . R. eliability Workshop. March 13, 2016. Limits of Charge Memory. Memory: Characterization. , Optimization, and . Recovery. Yixin Luo. yixinluo@cmu.edu. (joint work with Yu Cai, . Erich . F. Haratsch, Ken Mai, Onur Mutlu). 1. Presented in the best paper session at HPCA 2015. Flash Memory Programming:. Experimental Analysis, Exploits,. and Mitigation Techniques. Yu Cai, . Saugata Ghose. , Yixin Luo,. Ken Mai, Onur Mutlu, Erich F. . Haratsch. February 6, 2017. Executive Summary. Characterization, Mitigation, and Recovery. Yu . Cai. , . Yixin Luo. , Saugata Ghose, . Erich F. . Haratsch. *, Ken Mai, Onur Mutlu. Carnegie Mellon University, *Seagate Technology. Executive Summary. Functions. Yinglei. Wang, Wing-. kei. Yu, . Shuo. Wu, Greg . Malysa. , . G. Edward . Suh. , and Edwin C. . Kan. Cornell University. May 21. st. , . 2012. Outline. Motivation. Flash memory basics. Device fingerprinting. FLIN: Enabling Fairness and Enhancing Performance in Modern NVMe Solid State Drives August 7, 2019 Santa Clara, CA Saugata Ghose Carnegie Mellon University Executive Summary Modern solid-state drives (SSDs) use new storage protocols Conceptual Roadmap. PN junction. MOSFET. Flash Cell. Flash Blocks. Modern Devices. Put n-channels in p-substrate:. . drain (D), Source (S), Gate(G). Add a floating gate. Put a bunch together in NAND or NOR configuration. Lecture 5. Flash File Systems. September . 11. th. , . 2023. John . Kubiatowicz. Electrical Engineering and Computer Sciences. University of California, Berkeley. http://www.eecs.berkeley.edu/~kubitron/cs262.