PPT-Read Disturb Errors in MLC NAND Flash Memory:
Author : min-jolicoeur | Published Date : 2018-10-04
Characterization Mitigation and Recovery Yu Cai Yixin Luo Saugata Ghose Erich F Haratsch Ken Mai Onur Mutlu Carnegie Mellon University Seagate Technology
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Read Disturb Errors in MLC NAND Flash Memory:: Transcript
Characterization Mitigation and Recovery Yu Cai Yixin Luo Saugata Ghose Erich F Haratsch Ken Mai Onur Mutlu Carnegie Mellon University Seagate Technology Executive Summary. Contact Information. Wesley Brown. wes@planetarydb.com. Twitter @. WesBrownSQL. Blog . http://www.sqlserverio.com. Today’s Topic Covers…. NAND Flash Structure. MLC and SLC Compared. NAND Flash Read Properties. . Yaakobi. , Laura . Grupp. . Steven Swanson, Paul H. Siegel, and Jack K. Wolf. Flash Memory Summit, August 2010. University of California San Diego. Efficient Coding Schemes for Flash Memories. Outline. Flash Serial NOR Flash SLC NAND Flash Spansion SIGMETRICS. ’14. Summary. Problem. : as P/E cycle increases, raw BER significantly increases beyond the fixed ECC capability. Goal. : this paper tries to extend lifetime by reducing # of bit errors in a page (to the extent which ECC can fix). in MLC NAND Flash Memory:. Characterization, Mitigation, and Recovery. Yu . Cai. , . Yixin Luo. , Saugata Ghose, . Erich F. . Haratsch. *, Ken Mai, Onur Mutlu. Carnegie Mellon University, *Seagate Technology. Done By: . Bashayer. Al- . Suroor. ID: 200800649. Outline:. Introduction to How Flash Memory Works. A sample list of USB . devices. USB . Interface. Flash Memory: Tunneling and Erasing. How simple is the flash memory. Chip-Off Forensic Analysis. of NAND Flash Memory Devices. Aya. . Fukami. , . Saugata. . Ghose. , . Yixin. . Luo, . Yu . Cai. , . Onur. . Mutlu. 1. Brief Summary of the Paper. Our Goal. : . Identify . VUI: Cheryl . Platz. PM: . Sharbani. Roy & Carl . Mekala. December 28, 2015 - Version 0.5. Background. Do Not Disturb . will first ship with Communications in Q1. It will first apply to the delivery of calls and messages, but will eventually apply to the delivery of any urgent or standard notification.. Lifetime with. W. rite-hotness . A. ware . R. etention . M. anagement . Yixin Luo. , Yu . Cai. , Saugata Ghose, . Jongmoo. Choi*, Onur Mutlu. Carnegie Mellon University, *. Dankook. University. WARM. Flash Memory Programming:. Experimental Analysis, Exploits,. and Mitigation Techniques. Yu Cai, . Saugata Ghose. , Yixin Luo,. Ken Mai, Onur Mutlu, Erich F. . Haratsch. February 6, 2017. Executive Summary. Exploiting Self-Recovery and Temperature Awareness. Yixin Luo. Saugata Ghose Yu Cai Erich F. Haratsch Onur Mutlu. HeatWatch. Storage Technology Drivers - 2018. 2. Store . large amounts . Characterization, Mitigation, and Recovery. Yu . Cai. , . Yixin Luo. , Saugata Ghose, . Erich F. . Haratsch. *, Ken Mai, Onur Mutlu. Carnegie Mellon University, *Seagate Technology. Executive Summary. Read Disturb Errors in MLC NAND Flash Memory: Characterization, Mitigation, and Recovery Yu Cai , Yixin Luo , Saugata Ghose, Erich F. Haratsch *, Ken Mai, Onur Mutlu Carnegie Mellon University, *Seagate Technology Prof. Onur Mutlu. Carnegie Mellon University. Emerging Memory Technologies Lectures. These slides are . from the . Scalable . Memory Systems. course . taught at . ACACES . 2013 (July 15-19, 2013). Course Website:.
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