PPT-Read Disturb Errors

Read Disturb Errors in MLC NAND Flash Memory Characterization Mitigation and Recovery Yu Cai Yixin Luo Saugata Ghose Erich F Haratsch Ken Mai Onur Mutlu Carnegie Mellon University Seagate Technology. Marc Naguib. Behavioural. Ecology Group. Wageningen University. The Netherlands. marc.naguib@wur.nl. Effects of noise depend on. Signal structure. Signal function. Spatial characteristics. Noise characteristics. MLCs. with Bit-fixing Coding. Yue Li. joint work with. Anxiao. (Andrew) Jiang and . Jehoshua. . Bruck. Flash memories have excellent performance.. Cells are programmed by injecting electrons.. Programming is fast.. There’s a bug in our code. There’s a bug in our code. [Probably] The first software bug. Harvard Mark II. Electromechanical machine. Moth found in relay. Found by . Grace Hopper. Type of Errors. 3 that we’ll mention today. Do Not Disturb and Do Not Get Disturbed Ever since the compliance with the EMC Directive became mandatory worldwide, in the year 1993, T I. n . M. easurements and in Calculations. Types of . Experimental. Errors:. Random Errors. :. A result of variations in the performance of the instrument and/or the operator. Do NOT consistently occur throughout a lab. Fernanda Brito . Correia and Anabela Gomes. Polytechnic . Institute of . Coimbra. . fernanda@. isec.pt ; . anabela@isec.pt. Agenda. Programming learning difficulties. The study. Results analysis. Conclusions. Ben Zorn. Microsoft Research. In collaboration . with:. Emery Berger and Gene Novark, . UMass - Amherst. Karthik Pattabiraman, UIUC. Vinod Grover and Ted . Hart, Microsoft . Research. Ben Zorn, Microsoft Research. 1. Sampling Errors . arise due . to:. . POPULATION SPECIFICATION ERROR—when the researcher does not understand who (s)he should survey. For e.g. in a survey about breakfast cereal consumption - who should be surveyed? The mother makes the purchase decision, but the children influence her choice.. in MLC NAND Flash Memory:. Characterization, Mitigation, and Recovery. Yu . Cai. , . Yixin Luo. , Saugata Ghose, . Erich F. . Haratsch. *, Ken Mai, Onur Mutlu. Carnegie Mellon University, *Seagate Technology. Mr. Putter and Tabby Write the Book. By: Cynthia . Rylant. . Meg wrote a “Do not . disturb. ” sign so she would be left alone.. disturb. Making noise that bothers him or her. Say the word. (and Security) Issues of DRAM and NAND Flash Scaling. Onur Mutlu. omutlu@gmail.com. http://users.ece.cmu.edu/~omutlu. /. HPCA Memory . R. eliability Workshop. March 13, 2016. Limits of Charge Memory. Risk Reduction . How do you define a medication error?. “any preventable event that may cause or lead to inappropriate medication use or client harm while the medication is in the control of the healthcare professional, client, or consumer.”. . Youness R. Karodeh, B.Sc., Pharm.D., R.Ph. .. Assistant Dean, Associate Professor and . Director of Nontraditional Doctor of Pharmacy Program. Howard University, College of Pharmacy. Washington, D.C. Characterization, Mitigation, and Recovery. Yu . Cai. , . Yixin Luo. , Saugata Ghose, . Erich F. . Haratsch. *, Ken Mai, Onur Mutlu. Carnegie Mellon University, *Seagate Technology. Executive Summary.