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ATE Test Time Reduction by Scaling Voltage and Frequency ATE Test Time Reduction by Scaling Voltage and Frequency

ATE Test Time Reduction by Scaling Voltage and Frequency - PowerPoint Presentation

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Uploaded On 2018-09-23

ATE Test Time Reduction by Scaling Voltage and Frequency - PPT Presentation

Praveen Venkataramani Advisor Vishwani D Agrawal Problem statement Test is not free Test time is proportional to test cost Scan based test clock period is limited by the maximum power consumed ID: 677386

2014 test clock time test 2014 time clock power contest doctoral thesis tttc total ate proposed methods cycles aperiodic

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