PPT-Reducing ATE Test Time by Voltage

Author : emma | Published Date : 2024-01-29

and Frequency Scaling BY Praveen Venkataramani Committee Members Prof Vishwani D Agrawal Chair Prof Fa Foster Dai Prof Adit Singh External Reader Prof Sanjeev

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Reducing ATE Test Time by Voltage: Transcript

and Frequency Scaling BY Praveen Venkataramani Committee Members Prof Vishwani D Agrawal Chair Prof Fa Foster Dai Prof Adit Singh External Reader Prof Sanjeev Baskiyar. a. nd Its Applications. Praveen Venkataraman. i. pzv0006@auburn.edu. Suraj Sindia. szs0063@auburn.edu. Vishwani D. Agrawal. vagrawal@eng.auburn.edu. 14. th. IEEE Latin-American Test Workshop. Cordoba, Argentina. Praveen Venkataramani. Suraj Sindia . Vishwani D. Agrawal. Finding Best Voltage and Frequency to Shorten Power Constrained Test Time. 4/29/2013. 31. st. IEEE VLSI Test Symposium. Performance Check. 2015. Process Stress Level Challenges. Inconsistent Quality and Production Yield. Random Process breakdowns. Not able to trace the faults that brought down the production. Discard of raw materials after process breakdowns. Testtimeat Optimumvoltagetesttime Circuit nominalvoltage1.8V Periodicclock Aperiodicclock Name Periodic Aperiodic Optimum Test Optimum Test clock clock voltage time voltage time s298 1 0.52 1.07V 0.35 2. Raw Material. Supplier. (i.e. Leadframe). Component. Manufacturing. PC Board . Assembly. System. Assembly. End-Use. Customer. Control Points. for Emphasis. Development. Manufacturing. FSC Worldwide Quality & Reliability. Reliability:. Reducing burn-in time through high-voltage stress test and . Weibull. statistical analysis. ECE . 7502 Class Discussion . Xinfei Guo. 19. th. March 2015. Reliability. 2. [1] . Zakaria. Vishwani. D. . Agrawal. vagrawal@eng.auburn.edu. 11/7/2012. ITC '12: Elevator Talk. 1. Support from NSF Grant 1116213. Effects of Reducing Supply Voltage. Critical path slows down.. Power reduces as V. Lab activity in preparation for practical exam. AS level biology. Food Tests. Food Tests. What is Benedict's Test for Reducing Sugars?. What are reducing sugars?. Reducing sugars. What is the procedure for the Benedict's Test for reducing sugars?. Praveen Venkataramani. Advisor: . Vishwani. D. Agrawal. Problem statement. “Test is not free* – Test time . is proportional to test cost”. Scan based test clock period is limited by the maximum power consumed . ISO 9001 2015 The World’s Source for High Voltage Test Equipment MADE IN THE USA High Voltage, Inc. • hvinc.com • p. 518.329.3275 • f. 518.329.3271 • 31 County Route 7A • Copake, NY 12516 USA Designed by Electrochemical Workstation ZIVE SP1Corrosion Free software upgrade Internal 350,000 data point storage & continuing experiment regardless of PC failure. 3 measurement/control voltage ran Designed byElectrochemical Workstation ZIVE SP1CorrosionFree software upgradeInternal 350000 data point storage continuing experiment regardless of PC failure3 measurement/control voltage ranges 8 Rev 9b 12/24/19 EMI Suppression Capacitors Y2 Class AEC-Q200 type MEYA-300V Series Good Self-Healing Property Y2 Class for Interference Suppression Metallized Polypropylene Film Non-Inductive Wound Co M. . Marchevsky. , LBNL. 4/16/2018. M. Marchevsky. 1. • . IEC/UL 60601-1 3rd Edition . • UL 1598/CSA C22.2 No. 250.0-08 3rd Edition . • BS EN 60204-1:2006 + A1:2009 . • IEC/UL 60335-1 5th Edition .

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