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Supplementary Material ESI for Nanoscale This journal Supplementary Material ESI for Nanoscale This journal

Supplementary Material ESI for Nanoscale This journal - PDF document

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Supplementary Material ESI for Nanoscale This journal - PPT Presentation

brPage 1br Supplementary Material ESI for Nanoscale This journal is 57513 The Royal Society of Chemistry 2011 brPage 2br Supplementary Material ESI for Nanoscale This journal is ID: 83553

brPage 1br Supplementary Material ESI

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Nanoporous Alumina-based Interferometric Transducers Ennobled Roman Dronov, Andrew Jane, Joseph G. Shapter, Alastair Hodges, and Nicolas H. Voelcker Electronic Supplementary Information Figure S1. EOT evolution of a composite porous alumina/Pt film upon adsorption of (A) BSA: (1) 10 mM phosphate buffer pH 5.0; (2) 14.7 µM BSA in 10 mM phosphate buffer pH 5.0; (3) 10 mM phosphate buffer pH 5.0. B): adsorption of human IgG Ab: (1) 0.5 mM phosphate buffer pH 6.0; (2) 0.6 µM human IgG Ab in 0.5 mM phosphate buffer pH 6.0; (3) 0.5 mM phosphate buffer pH 6.0. Porous alumina etching conditions: 0.3 M oxalic acid, 2 min, 100 V, 0°C, followed by chemical etching in 5% H for 150 min at 20°C, hydroxylated in Hcoated with 15 nm Pt. Figure S2. Dependence of the full width at half maximum of the Fourier transform of interferometric reflectance spectra measured for composite porous alumina/Pt films with various Pt layer thicknesses. Table S1. Comparison of calculated RIU sensitivities for 1 µm thick porous alumina and porous silicon samples assuming 50% porosity upon pore-filing medium exchange from air to water. Porous alumina (n=1.768@600 nm) Porous silicon (n=3.947@600 nm) EOT in air (n=1) 1384 nm 2474 nm EOT in water (n=1.333) 1550 nm 2640 nm EOT / nm 167 nm 166 nm EOT /12.07% 6.71% RIU sensitivity 36.25% 20.15%