Tran sm ission Lin Mod l RR WL U W L RR 2006 International Conference on Microelectronic Test Structures 1424401674062000 575132006 IEEE 13 brPage 2br RR L W L RR RL R B Cu rren d rectio n in flu en ce Di ffusion Silic de Blocking mask 14 brPage 3br ID: 23175
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