PPT-Diagnostic Test Pattern Generation and Fault Simulation for

Committee Vishwani D Agrawal Adit Singh Victor P Nelson Bogdan M Wilamowski Mar 21 2012 1 Student Yu Zhang Auburn University Auburn Alabama 36849 USA University Reader. Towards a standardised Taxonomy. Dr Samir Khan . Dr Paul Philips. Mr Chris Hockley. Prof Ian Jennions. 5. th. November 2012. Overview of the NFF problem. Cause and impact of NFF. Localisation. using. MAX-SAT & Backbones. Georg Weissenbacher. Charlie . Shucheng. Zhu, . Sharad. . Malik. Princeton University. (Photo: Intel Press Kit). Where did things go wrong?. Intel Pentium FDIV Bug 1994. . Vishwani. D. . Agrawal. Auburn University, Auburn, Alabama . 36849. 5/13/2010. NATW 10. 1. A Diagnostic Test Generation System. Outline . 5/13/2010. NATW 10. 2. Introduction: . Diagnostic ATPG p. Localisation. using. MAX-SAT & Backbones. Georg Weissenbacher. Charlie . Shucheng. Zhu, . Sharad. . Malik. Princeton University. (Photo: Intel Press Kit). Where did things go wrong?. Intel Pentium FDIV Bug 1994. Labor 2. BIST Optimization . Sergei Kostin. 2. BIST (Built-in Self Test). ehk . sisseehitatud isetestimine. . on digitaalskeemi. . (mikroskeemi, plaadi, süsteemi jms) omadus iseennast testida.. . 1 Netlist Fault Collapsing Reduced Fault List Test Generation Fault Simulation abeeh 2 two faults h-sa0 and j-sa1 are structurally equivalent.This is because if we apply each of these faultsseparatel ECE . 7502 Class Discussion . Reza . Rahimi. 10. th. Feb 2015. Requirements. Specification. Architecture. Logic / Circuits. Physical Design. Fabrication. Manufacturing Test. Packaging Test. PCB Test. Mango Chia-Tso Chao (. 趙家佐. ). EE, NCTU, Hsinchu Taiwan. Outline. Introduction to Scan-based Testing. Input-Pattern Compression. Type of compressions. Compression schemes. Low-power decompression. Karen Felzer. USGS Pasadena. Preliminary Work!!. Subject to change!. The ETAS simulations assign aftershock density with distance, . r. ,. from the . mainshock. as:. Aftershock density = 1/(r . dmin). F. or embedded memory. Minghuan. Zhao. 1. 2. Fault Characteristics. Address-Decoder Fault (AF). Stuck-At Fault (SAF). Transition Fault (TF). Coupling . Fault (CF. ). 3. Traditional solution. Walking Pattern-Complexity 2N. NXP Semiconductors. Presenter: Don O’Riordan, Cadence. Analog Fault Sensitivity Analysis (FSA) in SPECTRE. Agenda. Background. Approach. Results. Conclusion. Acknowledgements & References. 2. Background. Dr Annette PlddemannDepartment of Primary Care Health SciencesCentre for Evidence-Based Medicinewwwoxforddecnihracuk/horizon-scanningSo 5arSystematic reviewRandomised controlled trialHow should I trea Yu Zhang. . Vishwani. D. . Agrawal. Auburn University, Auburn, Alabama 36849 USA. 1. 3/29/2010. IEEE LATW 10. Introduction. Need for diagnosis:. Debugging over large chip area. Complex manufacturing process. WHAT IS EVIDENCE - BASED MEDICINE (EBM)?. The translation of medical research into clinical practice. Integration of best research evidence with clinical experience and patient values. Knowing how to use clinical literature to ensure optimal patient care.