ATOMIC FORCE MICROSCOPY Introduction and theoretical background - PowerPoint Presentation

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Uploaded On 2018-09-22

ATOMIC FORCE MICROSCOPY Introduction and theoretical background - PPT Presentation

Jenny Malmstrom AFM invented by Binning and coworkers in 1986 Belongs to the Scanning Probe Microscopy family Binning et al Physics Review Letters 1986 AFM invented by Binning and coworkers in 1986 ID: 675342

scanning microscopy afm tip microscopy scanning tip afm force probe surface mode resolution tunneling contact image imaging tapping cantilever atomic sample cantilevers

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