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Power Electronic Devices - PPT Presentation

Semester 1 Lecturer Javier Sebastián Electrical Energy Conversion and Power Systems Universidad de Oviedo Power Supply Systems Review of the physical principles of operation of semiconductor devices ID: 265628

power diodes voltage reverse diodes power reverse voltage diode current losses packages drop electric field characteristic schottky rrm ext high bias cathode

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Slide1

Power Electronic Devices

Semester 1

Lecturer: Javier

Sebastián

Electrical Energy Conversion and Power Systems

Universidad

de Oviedo

Power Supply SystemsSlide2

Review of the physical principles of operation of semiconductor devices.

Thermal management in power semiconductor devices.

Power diodes.Power MOSFETs.The IGBT

.High-power, low-frequency semiconductor devices (

thyristors).2

OutlineSlide3

Lesson 3 - Power diodes.

Semester 1 -

Power Electronics Devices

Electrical Energy Conversion and Power Systems

Universidad

de Oviedo

3Slide4

4

Outline

The main topics to be addressed in this lesson are the following:

Review of diode operation.

Power diode packages.

Internal structure of PN and Schottky

power diodes. Static characteristic of power diodes.

Dynamic characteristic of power diodes.

Losses in power diodes. Slide5

5

Review of

PN-diode operation (I)

Modern diodes are based either on PN or Metal-semiconductor (MS) junctions.

Reverse bias and moderate forward bias are properly described by the following equation

(by Shockley): i = I

S·(evext

/VT - 1)

,

where VT

= kT/q and

I

s is the

reverse-bias saturation current

(a very small value).

i

v

ext

+

-

V

ext

[

V]

0

100

0

.

25

-

0

.

25

i

[mA

]

0

.

5

-10

-

0

.

5

0

i

[nA

]

V

ext

[

V]

i

»

I

S

·e

V

ext

V

T

(

exponential)

i

»

-

I

S

(

constant) Slide6

6

Review of

PN-diode operation (II)

When the diode has been heavily forward biased (high forward current),

the voltage drop is proportional to the current (it behaves as a resistor).

When the reverse voltage applied to a diode reaches the critical value VBR

, then the weak reverse current starts increasing a lot. The power dissipation usually becomes destructive for the device.

i

v

ext

+

-

0

1

-4

3

i

[A

]

V

ext

[

V]

According to Shockley equation

Actual I-V characteristic

According to Shockley equation

Actual I-V characteristic

0

-V

BR

10

i

[A

]

V

ext

[

V]

-600Slide7

7

Review of

PN-diode operation (III)

Static model for a diode (asymptotic):

i

v

ext

+

-

0

i

[A

]

V

ext

[

V]

Actual I-V characteristic

V

Slope

= 1/r

d

Equivalent circuit:

Model

V

r

d

= 1/tg

a

Actual

(

a

symptotic

)

ideal

V

=

K

nee voltage

r

d

=

Dynamic

resistance

aSlide8

8

Review of

PN-diode operation (IV)

Ideal diode:

i

v

ext

+

-

0

i

[A

]

V

ext

[

V]

Ideal diode

Whatever the forward current is, the forward voltage drop is always zero.

Whatever the reverse voltage is, the reverse current is always zero.

The ideal diode behaves as a short-circuit in forward bias.

The ideal diode behaves as a open-circuit in reverse bias. Slide9

9

Review of

PN-diode operation (V)

Low-power diode.

Anode

Cathode

P

ackage

(glass

or

epoxi

resin)

Terminal

Terminal

P

N

Marking

stripe on the cathode end

M

etal-semiconductor contact

Semiconductor

die

Anode

Cathode

Metal-semiconductor contactSlide10

10

Packages for diodes (I)

Axial leaded through-hole packages

(

low power).

DO 35

DO 41

DO 15

DO 201Slide11

11

Packages for diodes (II)

Packages to be used with heat sinks.Slide12

12

Packages for diodes (III)

Packages to be used with heat sinks

(higher power levels).

B 44

DO 5 Slide13

13

Packages for diodes (IV)

A

ssembly

of 2 diodes (I).

Doubler

(2 diodes in series)

Common cathode

(Dual center tap Diodes)Slide14

14

Packages for diodes (V)

A

ssembly

of 2 diodes (II).Slide15

15

Packages for diodes (VI)

2 diodes in the same package, but without electrical connection between them.Slide16

16

Packages for diodes (VII)

Manufacturers frequently offer a given diode in different packages.

Name

PackageSlide17

17

Packages for diodes (VIII)

A

ssembly

of 4 diodes (low-power bridge rectifiers).

Dual in lineSlide18

18

Packages for diodes (IX)

A

ssembly

of 4 diodes

(medium-power bridge rectifiers).Slide19

19

Packages for diodes (X)

A

ssembly

of 4 diodes (high-power bridge rectifiers).Slide20

20

Packages for diodes (XI)

A

ssembly

of 6 diodes (Three-phase bridge rectifiers).Slide21

21

Packages for diodes (XII)

Example of

a company portfolio regarding single-phase bridge rectifiers.Slide22

22

Internal structure of

PN power diodes (I)

Basic internal structure of a

PN power diode.

P

+

N

+

(substrate)

N

-

(epitaxial layer)

Aluminum contact

Aluminum contact

10

m

m

250

m

m

100

m

m

(for

V

BR

=

1000V

)

N

D1

= 10

14

cm

-3

N

D2

= 10

19

cm

-3

N

A

= 10

19

cm

-3

Anode

CathodeSlide23

N

+

N

-

Cathode

23

Internal structure of PN power diodes (II)

Problems due to the

nonuniformity

of the

electric field.

Anode

P

+

Depletion region in reverse bias

High electric field intensity

Breakdown electric field intensity can be reached in these regions.

Regions with local high electric-field should be avoided when the device is designed. Slide24

N

+

N

-

Cathode

24

Internal structure of PN power diodes (III)

Use of guard rings to get a more uniform electric field.

The depletion layers of the guard ring merge with the growing depletion layer of the P

+

N

-

region, which prevents the

radius of curvature

from getting too

small. Thus there are not places where the electric field reaches very high local values.

Anode

P

+

P

P

Aluminum contact

Aluminum contact

SiO

2

SiO

2

Guard ring

Depletion region in reverse biasSlide25

N

+

N

-

Cathode

25

Internal structure of PN power diodes (IV)

Case

where

the metallurgical junction extends to the silicon surface (I).

Anode

P

+

High electric field intensity in these regions

Depletion region in reverse biasSlide26

26

Internal structure of PN power diodes (V)

Case

where

the metallurgical junction extends to the silicon surface (II).

The use of beveling minimizes the electric field intensity.

Coating the surface with appropriate materials such as silicon dioxide helps control the electric field at the surface.

N

+

N

-

P

+

Cathode

Anode

Depletion region in reverse bias

SiO

2

SiO

2Slide27

N

+

N

-

Cathode

27

Internal structure of

Schottky

power diodes (I)

Problems due to the

nonuniformity

of the

electric field.

Anode

High electric field intensity

Breakdown electric field intensity can be reached in these regions.

Regions with local high electric-field should be avoided when the device is designed.

Aluminum contact

(

N

+

M

Þ

ohmic

)

SiO

2

Depletion region in reverse bias

Aluminum contact

(

N

-

M

Þ

rectifying

)Slide28

N

+

N

-

Cathode

28

Internal structure of

Schottky

power diodes (II)

Use of guard rings to get a more uniform electric field.

The depletion layers of the guard ring merge with the growing depletion layer of the N

-

M region, which prevents the

radius of curvature

from getting too

small.

Anode

P

P

Aluminum contact

(

N

-

M

Þ

rectifying

)

Aluminum contact

(

N

+

M

Þ

ohmic

)

SiO

2

SiO

2

Guard ring

Depletion region in reverse biasSlide29

29

Information given by the manufacturers

Static characteristic:

- Maximum peak reverse voltage.

- Maximum forward current.

- Forward voltage drop. - Reverse current.

Dynamic characteristics:- Switching times in PN diodes.

- Junction capacitance in Schottky diodes.Slide30

30

Maximum peak reverse voltage.

Sometimes,

m

anufacturers

provide two values:

- Maximum r

epetitive peak reverse voltage

, VRRM

.-

Maximum non repetitive peak reverse voltage, V

RSM

.Slide31

31

Maximum forward current.

M

anufacturers

provide two or three different values:

- Maximum RMS forward current

, IF(RMS)

.

- Maximum

repetitive peak forward current, IFRM

.

-

Maximum

surge non repetitive forward current

,

I

FSM

.

I

F(RMS)

depends on the package.Slide32

32

Forward voltage drop, V

F (I).

The forward voltage drop increases when the forward current increases.

It increases linearly at high current level.

i

V

ext

I

D

V

D

5 A

V

r

d

ideal

Load line

Operating point

Actual I-V characteristic given by the manufacturer (in this case is a V-I curve). Many times, current is in a log scale.

Operating pointSlide33

33

Forward voltage drop, V

F (II).

The higher the value of the maximum peak reverse voltage V

RRM, the higher the forward voltage drop VF at I

F(RMS).Slide34

34

Forward voltage drop, V

F (III).

I

t can be directly obtained from the I-V characteristic

, for any possible current.

I

F(AV)

= 4A, V

RRM

= 200V

1.25V @ 25A

2.2V @ 25A

As the values of

I

F(RMS)

, I

FRM

and I

FSM

are quite different, the scale corresponding to current must be quite large.

Due to this, forward voltage drop corresponding to currents well below

I

F(RMS)

cannot be observed properly.

Therefore, log scales are frequently used.

I

F(AV)

= 5A,

V

RRM

= 1200VSlide35

35

Forward voltage drop, V

F (IV).

In log scales.

0.84V @ 20A

1.6V @ 20A

I

F(AV)

= 25A, V

RRM

= 200V

I

F(AV)

= 22A, V

RRM

= 600VSlide36

36

Forward voltage drop, V

F (V).

Schottky diodes exhibit

better forward voltage drop, at least for

VRRM < 200 (for silicon devices).

0.5V @ 10ASlide37

37

Forward voltage drop, V

F (VI).

Silicon Schottky diode with high V

RRM

.

The forward

voltage drop is quite similar to the one corresponding to a PN diode.

0.69V @ 10ASlide38

38

Forward voltage drop, V

F (VII).

Schottky

Schottky

PN

In case of diodes with similar values of V

RRM

, the forward voltage drop is quite similar in PN and Schottky diodes, in both cases made up of silicon.

However, Schottky diodes always have superior performances from the dynamic point of view.

Comparing

s

ilicon Schottky and PN diodes, taking into account their V

RRM

.Slide39

39

Reverse current, I

R (I).

It is measured

at VRRM.

It depends on the values of I

F(AV) and VRRM (the higher I

F(AV) and VRRM

, the higher IR). It increases when the reverse voltage and the temperature increase.

I

F(AV)

= 4A, V

RRM

= 200V

I

F(AV)

= 5A, V

RRM

= 1200V

I

F(AV)

= 8A, V

RRM

= 200VSlide40

Reverse current, I

R

(II).

I

R

increases when

I

F(AV)

and

T

j

increase

.

I

R

decreases when V

RRM

increases.

I

F(AV)

= 10A, V

RRM

= 170V

I

F(AV)

= 10A, V

RRM

= 40V

Case of

Schottky

diodes

:

40Slide41

Dynamic characteristic of power diodes (I).

41

In the case of PN diodes, manufacturers give information about switching times, reverse recovery current and forward recovery voltage (slides 108-111, Lesson 1).

t

s

= storage time.

t

f = fall time.t

rr =

ts + t

f = reverse recovery.

i

v

t

t

t

rr

t

s

t

f

Reverse recovery peak

t

d

= delay time.

t

r

=

rise time.

t

fr

= t

d

+

t

r

= forward recovery time.

v

t

Forward recovery peak

i

t

r

t

d

t

fr

tSlide42

Dynamic characteristic of power diodes (II).

42

The waveforms given by manufacturers correspond

to switch-off and to switch-on inductive loads, because this is the actual case in most of the power converters.

Switch-on

I

F

(

AV

)

=

2x8A

,

V

RRM

=

200V

Switch-offSlide43

Dynamic characteristic of power diodes (III).

43

More information given by manufacturers (example). Slide44

Dynamic characteristic of power diodes (IV).

44

In the case of Schottky diodes, manufacturers give information about the depletion layer capacitance (or junction capacitance, slides 103-106 and 116, Lesson 1).

C

j

= A·

2·(

V

0

+

Vrev

)

·

q·N

D

Metal

N

+

+

+

+

+

+

+

+

-

-

-

-

-

-

-

-

N-type

N

D

0

V

rev

C

j

C

jSlide45

Dynamic characteristic of power diodes (V).

45

I

nformation

given by manufacturers (example).Slide46

Losses in power diodes (I).

46

Static losses:

Reverse losses

Þ negligible in practice due to the low value of I

R.

Conduction losses Þ They must be taken into account. Switching (dynamic) losses:

Turn-on losses. Turn-off losses Þ

higher switching losses.

i

D

Example

Conduction power losses

:

Instantaneous value:

p

D_cond

(t) =

v

D

(t)·

i

D

(t) = [V

+

r

d

·i

D

(t)

]

·

i

D

(t)

Average power in a period:

V

r

d

Ideal

(lossless)

i

D

v

D

+

-

P

D_cond

= V

·I

avg

+

r

d

·I

RMS

2

I

avg: average value

of

iD(t)

IRMS

: RMS

value of

iD

(t)ÞSlide47

Losses in power diodes (II).

47

Turn-off losses

:

a

ctual

waveforms.

Tu

rn

-off losses in the diode take place during

t

f.

Moreover, remarkable losses take place in other devices (transistors) during

t

s

.

t

rr

= 30ns

i

D

t

V

D

t

0.8 V

-200 V

10 A

3 A

t

f

t

s

Power losses in the diode

Power losses in a transistor

Instantaneous value:

p

D_s

_

off

(t) =

v

D

(t)·

i

D

(t)

i

D

v

D

+

-

Average power in a period:Slide48

Losses in power diodes (III).

48

I

nformation

given by manufacturers (example).

(Diode STTA506 datasheet

) Slide49

Losses in power diodes (IV).

49

(Diode STTA506 datasheet

) Slide50

Losses in power diodes (IV).

50

(Diode STTA506 datasheet

)