PPT-Probabilistic Bug-Masking Analysis for Post-Silicon Tests i

Doowon Lee Tom Kolan Arkadiy Morgenshtein Vitali Sokhin Ronny Morad Avi Ziv Valeria Bertacco University of Michigan IBM Research Haifa example of processor die. Localisation. using. MAX-SAT & Backbones. Georg Weissenbacher. Charlie . Shucheng. Zhu, . Sharad. . Malik. Princeton University. (Photo: Intel Press Kit). Where did things go wrong?. Intel Pentium FDIV Bug 1994. ECE . 7502 Class Discussion . B. en Calhoun. Thursday January 22, 2015. Requirements. Specification. Architecture. Logic / Circuits. Physical Design. Fabrication. Manufacturing Test. Packaging Test. PCB Test. Localisation. using. MAX-SAT & Backbones. Georg Weissenbacher. Charlie . Shucheng. Zhu, . Sharad. . Malik. Princeton University. (Photo: Intel Press Kit). Where did things go wrong?. Intel Pentium FDIV Bug 1994. A . Hybrid Approach. Abigail . Goldsteen. , . Ksenya. . Kveler. , Tamar . Domany. , Igor . Gokhman. , Boris . Rozenberg. , Ariel . Farkash. Information Privacy and Security, IBM Research – Haifa. Presented by . cooling - Update. 07 Sep 2010. 1. G. Nüßle. Outline. Test . of. 1st . full-scale. prototype. Hydraulic. . behaviour. Thermal . behaviour. Layout . optimization. . for. . the. prototype. Structural. Andria C. Schwortz , Andrea . C. . Burrows , Adam D. Myers. The . authors studied a matched set of 7. 7 participants . working with 200-. entry databases . in astronomy using Google Spreadsheets, with limited . Patrick Barlow . and Tiffany Smith. THREE MAJOR CATEGORIES OF STATISTICAL TESTS:. Descriptive Statistics. Parametric Statistics. Non-Parametric Statistics. Some Key Terms. Null Hypothesis. Alternative Hypothesis. Daher . Kaiss, Jonathan Kalechstain. Formal Engines and . Technologies Team. Core CAD . Technologies. Intel Corp. . - Haifa. Agenda. Motivation. Speed path debug at Intel. Introducing our tool: NGSPA. Reviewer: . Shuo-Ren. , Lin. 2012/5/11. ALCom. 1. Abstract. Post-silicon functional validation challenges. Light overhead associated with the testing procedures. High-quality validation. Post-silicon functional exerciser. Doowon Lee. *, Tom Kolan. †. , Arkadiy Morgenshtein. †. ,. Vitali Sokhin. †. , Ronny Morad. †. , Avi Ziv. †. , Valeria Bertacco*. * University of Michigan, . †. IBM Research − Haifa. example of processor die. Jordan . Radice. jordanra@buffalo.edu. Advanced . VLSI. Spring 2015. Dr. Ram Sridhar. Background. Moore’s Law (As we all know): Doubling of transistors every 1.5 ~ 2.0 years.. Dennard scaling works in conjunction with Moore’s law in that we maintain the overall power density of the chip area despite the exponential increase in transistors.. March 2020. What is masking & why does It happen?. Why does masking happen?. Nielsen is contractually obliged to apply Boots sensitivity rules to any data where Boots is included in coverage. This means that where they feel there would be an over exposure of trading for a product – the product will be masked.. Shelia Sloan. July 2022. Agenda. Background . Masking Changes on 4/24/22. New Masking Changes July 2022. Demo. Q&A. 2. Background. Masking as Delivered by Oracle traditionally is controlled by the Primary permission list of the user. . Sarat Buasai, Alexander McMahon, Yi Jie Wu. Advisors: Adam C. Powell, N. Aaron Deskins, Walter Towner. 01. Background. Project Goal. Methods. 02. 03. 04. 05. 06. Results and Discussion. Conclusion. Acknowledgement.