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Dual-sided readout studies Dual-sided readout studies

Dual-sided readout studies - PowerPoint Presentation

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Dual-sided readout studies - PPT Presentation

Chiara Casella Matthieu Heller Oliver Holme 1 Dualsided readout studies Difference in Left and Right light yield is used to estimate gamma interaction position along z axis Original AXPET concept was based on dualsided readout ID: 515749

position strips machined resolution strips position resolution machined aligned light esr yield faces data cross teflon wrapped fwhm sipm crystal tile energy

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Slide1

Dual-sided readout studies

Chiara CasellaMatthieu HellerOliver Holme

1Slide2

Dual-sided readout studies

Difference in Left and Right light yield is used to estimate gamma interaction position along z axis

Original AXPET concept was based on dual-sided readout

Initial studies showed insufficient z-axis resolution (~cm)

New results from A. Goertzen indicated better z resolution (~3.5mm)Investigation started to find best achievable resolutionFollowing A. Goertzen methodUsing digital SiPM for a compact axial module

L

R

z-axis

0

2Slide3

Laboratory setup

Philips digital SiPM tiles – L, R and TaggerL and R tiles are cooled to ~14˚C to reduce dark countOnly events with 3 tile coincidence are stored

Acts to collimate a beam of gamma photons

Automated data taking with Philips and LabVIEW software

Scans through several position along z-axis

3Slide4

Crystal scanning

3x3x100mm LYSO crystalsCrystal aligned with one SiPM pixelAll other cells were inhibited

Typical scan properties

11 data taking runs at different positions along z axis

Typical run properties~15 minutes (with 3.7 MBq source)Up to 9000 events stored to fileUp to 1300 events after photopeak cuts

4Slide5

Data processing for each z position

Data from SiPMs is converted to ROOT filesLight yield is processed:Cut on photopeaks (all three tiles)

Correct for SiPM cell saturation

Correct for SiPM intra-tile cross talk

Obtain photopeak central values

Raw data

Gaussian fit

Corrected data

5Slide6

Data processing for complete scan

z position estimator calculated as

for each event

Mean

for each z position is plotted against z

Fit function is applied to plot

Fit gives a relationship between any

value and z position

 

6

Error bars show

σ

of (R-L)/(R+L)

(R-L)/(R+L)

(R-L)/(R+L)

z

position [mm]Slide7

Data processing for complete scan

z axis resolution

FWHM

of

values for each z position mapped to FWHM of zBeam width is subtracted to obtain final

resolution

Beam size calculated as 1.7mm

 

7

R

z

FWHM

Error bars show

σ

of (R-L)/(R+L)

(R-L)/(R+L)

P

osition [mm]

FWHMSlide8

Crystals and surface treatments

Coatings/wrappings:BareWhite TiO

2

paint

Teflon (2 layers)Enhance Specular Reflector (ESR)Surface treatments (one or multiple faces):Polished (from manufacturer)Depolished (with ~10 µm powder)Machined strips (with CNC diamond tool)

8Slide9

Machined strips

Two patterns of machined stripsEvery 5mm, aligned on four faces

Every 5mm, staggered by 1.25mm on four faces

Machined strips are ~0.7mm wide

9Slide10

Results

10Slide11

Non-exponential LY versus z

Crystals with less attenuation

LY versus z is not exponential

Crystals with greater attenuation

LY versus z is more similar to exponential

Polished, teflon wrapped

Two faces depolished, teflon wrapped

11Slide12

Inter-tile cross talk

SiPMs have cross talk between cells in a tileIntra-cell cross talkCaused by avalanches producing secondary photons

The secondary photons

are emitted isotropically

They can also enter and propagate through the crystalInter-tile cross talkInter-tile cross talk reduces L & R differenceDegrades z resolutionThis degradation can be measured by capturing L and R tiles independently, with the other tile off

Not possible in real applicationsPhysically filtering the cross talk photons might be possible12Slide13

Photopeak shifting

LEFT

RIGHT

SUM

13

Machined strips, 5mm (aligned), teflon wrapped

z-axisSlide14

Light yields and energy resolution

14

Machined strips, 5mm (aligned), teflon wrappedSlide15

z resolution

15

Machined strips, 5mm (aligned), teflon wrappedSlide16

Different surface treatments

Resolution down to ~3mm has been achievedTreatments give different energy resolutions due to different LY sum

Polished + TiO

2 paint

Machined strips (four faces, aligned) + ESR Depolishing (two faces) + ESR

Energy resolution

Energy resolution [%]

16Slide17

Machined strips

Fine scans reveal discrete structureGives stepped LY patternSeen in LY sum and energy resolution too

Aligned strips, light yield - RIGHT

Staggered strips, light yield - RIGHT

Fitted photopeak position [pe]

Fitted photopeak position [pe]

Position [mm]

Position [mm]

Staggered strips give a pseudo-continuous behaviour

17Slide18

Depolishing

One face depolished + ESR

Two faces depolished + ESR

18Slide19

Wrappings

Four faced machined strips (aligned)

ESR wrapped

λ

eff ≈ 70 mm

Teflon wrapped

λeff ≈ 40 mm

Unwrapped λeff ≈ 28mm

Light yield - LEFT

Light yield - RIGHT

Light yield - SUM

z

[mm]

z

[mm]

z

[mm]

ESR gives almost constant LY SUM

19Slide20

Wrappings

Four faced machined strips (aligned)

Teflon and ESR give similar resolution

ESR gives more linear z position estimator

ESR gives more light to improve resolution further

20Slide21

Results summary

21

Crystal

surface

Wrapping/Coating

Rz FWHM

atmid-point (mm)

Energy resolution at mid-point (%)

PolishedBare52

8PolishedTeflon

228PolishedESR37

7

Polished

TiO

2

paint

3.1

15

Depolished

(1 face)

Bare

5.8

18

Depolished

(1 face)

Teflon

4.4

12

Depolished

(1 face)

ESR

4.9

8

Depolished (2 faces)

Teflon

3.4

16

Depolished

(2 faces)

ESR

3.7

11

Machined

strips (aligned)

Bare

3.6

21

Machined strips (aligned)

Teflon

2.6

12

Machined strips (aligned)

ESR

3.2

8

Machined strips (staggered)Teflon3.1

12

Machined strips (staggered)

ESR

3.8

7

A crystal with better R

z

at z=50mm is not necessarily better at other z positionsSlide22

Next steps and outlook

Improve results for 100mm crystalsExtend machined strips to full crystal lengthDepolish

more faces

Shorter 60mm crystalsCould achieve resolution down to 2mmAttenuation per mm would need to be increasedPhotodetectors with higher PDE ?Greater light yield would enable better resolutionCurrent SiPM PDE is about 40%22Slide23

23Slide24

Toy Monte Carlo results

Measured results are consistent with Toy MCEstimated ~3mm as best achievable resolutionCan indicate future possibilities

λ

eff

(mm)Crystal

Length (mm)Max LYRz

at mid-point FWHM (mm)33100

15003.0333

1003000

2.1433601500

2.2720601500

1.85

10

60

1500

1.99

20

60

3000

1.32

7

20

1500

0.70

7

20

3000

0.53

20mm crystal figures match other published studies

Increased LY improves resolution

60 mm crystals would enable improvement

down to 2mm with current light yields

24

Pure Poisson distribution

Noise

Not representative

 Slide25

Machined strips width

25Slide26

Depolished (one face)

26