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Lab-measurement results on IZM thin assemblies Lab-measurement results on IZM thin assemblies

Lab-measurement results on IZM thin assemblies - PowerPoint Presentation

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Uploaded On 2016-11-17

Lab-measurement results on IZM thin assemblies - PPT Presentation

Mathieu Benoit Outline Assembly process Methodology Results Sensor production and procurement Bumping at IZM Micron Sensor Wafer were sent to IZM for UnderBump Metallization and assembly to Timepix and Medipix3RX ASIC ID: 489986

100um w0126 100 pixel w0126 100um pixel 100 masked sr90 exposure pixels 30s izm assemblies k04 k06 k05 j08

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Slide1

Lab-measurement results on IZM thin assemblies

Mathieu Benoit Slide2

Outline

Assembly process

Methodology

Results Slide3

Sensor

production

and

procurement

: Bumping at IZM

Micron Sensor Wafer were sent to IZM for Under-Bump Metallization and assembly to Timepix and Medipix3RX ASIC

10 Sensor wafers processed by IZMThickness: 100,150,200,300,650,1500 um wafer <= 200 um thickness attached to handle wafer for processing

1

00um-on-100um assemblySlide4

Methodology

After wire-bonding, chip is powered, sensor biased at 40V

Chip threshold equalization is performed twice, mask pattern is written to disk

First equalisation lead to weird masked pixel pattern (

checkboard

)Second equalization works usually fineAn image of a Sr90 source is taken with Exposure time of 30s (every pixel should see some energy deposition)

A simple algorithm count how many pixel see no or too little signal (<20% of neighbors) and compare to mask Slide5

C03-W0126 (100-on-100um) Masked pixelsSlide6

C03-W0126 (100-on-100um) Sr90, 30s Exposure

229 masked pixel in C03-W0126

35567 pixel with no Sr90 in C03-W0126Slide7

J08-W0126 (100-on-100um) Masked pixelsSlide8

J08-W0126 (100-on-100um) Sr90, 30s Exposure

56 masked pixel in J08-W0126

56 pixel with no Sr90 in J08-W0126Slide9

J10-W0126 (100-on-100um) Masked pixelsSlide10

J10-W0126 (100-on-100um) Sr90, 30s Exposure

190 masked pixel in J10-W0126

195 pixel with no Sr90 in J10-W0126Slide11

K04-W0126 (100-on-100um) Masked pixelsSlide12

K04-W0126 (100-on-100um) Sr90, 30s Exposure

52 masked pixel in K04-W0126

52 pixel with no Sr90 in K04-W0126Slide13

K05-W0126 (100-on-100um) Masked pixelsSlide14

K05-W0126 (100-on-100um) Sr90, 30s Exposure

28 masked pixel in K05-W0126

39 pixel with no Sr90 in K05-W0126Slide15

K06-W0126 (100-on-100um) Masked pixelsSlide16

K06-W0126 (100-on-100um) Sr90, 30s Exposure

31 masked pixel in K06-W0126

31 pixel with no Sr90 in K06-W0126Slide17

Conclusion

New assemblies show pretty good yield for the bumping of 100um ASIC to 100um Sensors (5/6 perfect sensors)

Only one assembly with a catastrophic failure, plan to send it back to IZM for further X-Ray study, chip was fine before wire-bonding

Ian mention that assemblies were quite fragile

Maybe lift-off occurred during wire-bonding process

4 more assemblies with 150um n-in-p on 100um currently at the bonding lab

This is now our thinnest full functional module we ever did using this technology.I forwarded this results immediately to all colleagues involved in this task. Thomas Fritzsch

, IZMSlide18

Hitmap

, 100 on 100 um Assemblies

Unconnected pixels