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Anomalous X-ray Diffraction Studies for Photovoltaic Applic Anomalous X-ray Diffraction Studies for Photovoltaic Applic

Anomalous X-ray Diffraction Studies for Photovoltaic Applic - PowerPoint Presentation

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Anomalous X-ray Diffraction Studies for Photovoltaic Applic - PPT Presentation

Grisel Rivera Batista Science Undergraduate Laboratory Internship Program August 12 2010 Advantages of AXRD Sensitive to N eighboring elements in the periodic table Specific crystallographic phase ID: 624500

diffraction ray spinel axrd ray diffraction axrd spinel anomalous materials 2010 laboratory bettinger absorption misra scattering peak energy elements

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Slide1

Anomalous X-ray Diffraction Studies for Photovoltaic Applications

Grisel Rivera BatistaScience Undergraduate Laboratory Internship ProgramAugust 12, 2010.Slide2

Advantages of AXRD

Sensitive to:Neighboring elements in the periodic table.Specific crystallographic phase.Specific crystallographic site in a phase.Slide3
Slide4

AXRD

– Combination of Structural & Chemical Technique

Structural (XRD)

Chemical (XAS)X-rays diffract from specific planesDiffraction peak

Near resonant absorption energy

X-raysabsorbed

RESULT

Diffracted peak intensity

depending on elements present on diffracting planes

Misra

, S.,

Bettinger

J.,

Anomalous X-ray Diffraction (

AXRD), 5thAnnual

SSRL School on Synchrotron X-ray Scattering Techniques in Materials and Environmental Sciences: Theory and

Application. June

1st, 2010Slide5

f

n = f0(Q) + f ′(E

) + i f ′ ′(E)f0(Q) = normal (E independent)f ’(

E) = anomalous (E dependent)f ’’(E) = absorption (E dependent)

fn is the atomic scattering factor

x

n

,

y

n

,

z

n

are the (fractional) positions of the n

th

atom

Atomic scattering strength (

f

n

) varies near X-ray absorption edge

Varying X-ray energy near absorption edge →

total intensity changes

f

n

depends

on oxidation state of the element

Anomalous X-ray

Diffraction (AXRD

)

Misra

, S.,

Bettinger

J.,

Anomalous X-ray Diffraction (

AXRD), 5thAnnual

SSRL School on Synchrotron X-ray Scattering Techniques in Materials and Environmental Sciences: Theory and Application. June 1st, 2010Slide6

ZnO loaded with Gallium

Zinc

oxygen

Tetrahedral sites in

ZnO

cellSlide7
Slide8

Peak 100Slide9
Slide10
Slide11
Slide12

Spinel: ZnCo2O4

Zn, Co

OxygenSlide13

Spinel Inversion

Inversion determines the amount of each cation found on either the tetrahedral or octahedral site, and has a big effect on the electrical properties.

MixedSpinel (0 <n < 1)

Normal spinel (

n

= 0)

(

Co

)

(

Zn

)

(

Co

)

B A B

Inverse spinel (

n

= 1)

(

Co

) (

Co

)

(

Zn

)

B A B

Degree of Inversion ContinuumSlide14

Peak 311Slide15
Slide16
Slide17
Slide18

Conclusion

AXRD is an effective technique to characterize bulk and nanomaterials.Slide19

Acknowledgments

U.S. Department of Energy, Office of Science, through the Summer Undergraduate Laboratory Internship Program (SULI) Stanford Synchrotron Radiation Lightsource (SSRL) at SLAC National Accelerator Laboratory.

My mentors Michael Toney, Sumohan Misra, and Joanna Bettinger for their guidance during the realization of my project. Stephen Rock and all the SULI staff at SLAC for give me the opportunity to work during this summer under their program.Slide20

References

Bettinger, J., Misra, S. Anomalous X-ray Diffraction (AXRD), California. 2010. Bettinger

, J. Probing the Effects of Dopants, Defects, and Crystal Structure in Spinel Transparent Conducting Oxides for Photovoltaic Applicationsi, California. Granqvist, C. G., Transparent conductors as solar energy materials: A panoramic review, Department of Engineering Sciences, The Ångström Laboratory, Uppsala University, Uppsala, Sweeden. 2007.

 Introduction to X-ray Diffraction, Materials Research laboratory, University of California, Santa Barbara. 2010. Thomas, R.K., Simple Solids and their Surfaces [Online]. Available: http://rkt.chem.ox.ac.uk/tutorials/surfaces/solids.html Pecharsky, V. K., Zavalij, P.Y., Fundamentals of Powder Diffraction and Structural Characterization of Materials,

Page 146-152, Springer, New York. 2005.Cullity, B.D., Stock, S.R., Elements of X-Ray Diffraction, Page 31-47, Prentice Hall, New Jersey. 2001.Slide21

Questions

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