PPT-JITTER

IMPACT ON CLOCK DISTRIBUTION IN LHC EXPERIMENTS S BARON TWEPP 2012 AIM OF this talk Understand the contributions of all the systems to the bunch clock jitter RF system Long distance transmission . See References 1 2 and 3 ADCs are available with aperture jitter specifications as low as 60fs rms AD9445 14bits 125 MSPS and AD9446 16bits 100 MSPS Extremely low jitter sampling clocks must therefore be utilized so that the ADC performance is n 52 M z will have a pe riod of 6430 pic sec onds for one c lete cycle Successi ve c cles of a no is free wa ve form will measure exactly 6430 picos ec onds The noise elements that will cause the cloc k pe riod to va ry from 6430 p S are kn own as jitt 5 15 25 35 Jitter Freqiency in MHz RMS Jitter Sensitivity in picoseconds Jitter Measurements Using Phase Locked Loops Z ZQZ Z QQZ Z 587Z Z Q DUT Direct Low Jitter Reference Oscillator Phase Detector Loop Filter Measurement Filter Output at this p MSPS). Extremely low jitter sampling clocks mustperformance is not degraded, because the total jitter is the root-sum-square of the internal sampling clock generation are more often specified in terms Zhang. yanqing@virginia.edu. DLL Design for Low Power and Jitter. Outline. DLL Quick Review. Seminal Papers. First “dual loop” with infinite phase capture range. First true dual loop architecture. 2.1.Jitter measurements Jitter (absolute) is the cycle-to-cycle variation of fundamental frequency, i.e. the average absolute difference between consecutive periods, expressed as: ()=-iiJitterabsolut Jonathan Owen. Project Purpose. Explain the following concepts:. Theory of DDS operations. Nyquist. zones. Basics of clock jitter. DAC output modes. Clock jitter effects on DDS Waveforms. Acronyms. DDS – Direct Digital Synthesis. Abstract: Total Jitter is an increasingly important quantity in the development and specification of serial data links but, while it is well defined, it is not well understood. Total Jitter is like pe Cooray. G, . Leonardis. L, . Löseth. S, Machado FCN, Maldonado A, Martinez-. Aparicio. C, Sandberg A, Smith B, . Widenfalk. J, Kouyoumdjian JA. Data were also provided by . I. Tomohiro, M. Sonoo, K. Arimura and Y. Arimura. FONT Meeting 19 Feb 2014. 1. Parasitic Studies. D. R. Bett. Shift 1 – 23/01/14. D. R. Bett. 2. FONT Meeting 10 Feb 2014. Run/scan name. Description. Cal. Get. . for. P2, P3. loPhase1. Get. . . 2.2.2012. Goal: monitor clock jitter during ramping BEAM1 clock. . more than 10 ramps done . . different CORDE delay ranging from 4.4ns to 10ns. . PbPb. 2011 delays were 4.4ns - 6.7ns.. also blow-up applied (a slow change of frequency roughly in the middle of the ramp) . PhD thesis defense. Amit . Mondal. Committee. :. Aleksandar Kuzmanovic, . Asst. Professor, Northwestern . Univ. Peter . Dinda. , Assoc. . Professor, Northwestern . Univ. Yan Chen, . Assoc. Professor, Northwestern . Victor Alberto Lopez Nikolskiy. Some theory first. http://knowyourmeme.com/memes/pepe-silvia. Clock jitter. Jitter is the timing variation of a signal edge from its ideal value. In the frequency domain it would look like a broadening of the carrier frequency. Jitter is caused by the superposition of noise sources: the oscillator crystal has thermal noise and creates mechanical perturbations, . Electrical & Computer Engineering. University of Illinois. jesa@illinois.edu. ECE . 546 . Lecture . - . 24. Jitter Analysis. Measuring Jitter. Eye Diagrams. Eye diagrams are a time domain display of digital data triggered on a particular cycle of the clock. Each period is repeated and superimposed. Each possible bit sequence should be generated so that a complete eye diagram can be made.