Garth J Williams Representative experiments We consider two microscopy techniques as examples Differential Phase Contrast DPC Physical limits on image contrast are driven by the index of refraction so phase contrast is often dominant Normally a sample is ID: 673309
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Slide1
Stability needs for state-of-the-art user experiments at NSLS-II
Garth J WilliamsSlide2
Representative experiments
We consider two microscopy techniques as examples
Differential Phase Contrast (DPC)
Physical limits on image contrast are driven by the index of refraction, so phase contrast is often dominant. Normally, a sample is
scanned
through a focused x-ray beam.
Coherent Diffractive
I
maging (CDI), including full-field, reciprocal-space Bragg CDI and scanning-point, real-space
ptychography
Uses a continuous, normally far-field, diffracted intensity to recover the complex field leaving the sample. The amplitude and phase of the field is then interpreted to discover structure and deformation. This normally requires data sets
formed by collections of 2D images
. The requirements on the coherence of the x-ray field are very stringent.Slide3
Representative experiments
We consider two microscopy techniques as examples
Differential Phase Contrast (DPC)
Physical limits on image contrast are driven by the index of refraction, so phase contrast is often dominant. Normally, a sample is
scanned
through a focused x-ray beam.
Coherent Diffractive
I
maging (CDI), including full-field, reciprocal-space Bragg CDI and scanning-point, real-space
ptychography
Uses a continuous, normally far-field, diffracted intensity to recover the complex field leaving the sample. The amplitude and phase of the field is then interpreted to discover structure and deformation. This normally requires data sets
formed by collections of 2D images
. The requirements on the coherence of the x-ray field are very stringent.Slide4
Scanning transmission DPC in detail
The intensity is attenuated and shifted
The angular shift is due to phase retardation in the sample
The shift is measured by comparing opposing
d
etector elements.
This is governed by the index of refraction in the sampleSlide5
Fluorescence imaging
measured “at the focus”
Horizontal Phase Gradient
Measured “at ~0.5 m away from the focus”
1 um
Stability in DPC at NSLS-II
Courtesy Yong ChuSlide6
doi:10.1038/nphoton.2012.209
Coherent Diffractive Imaging
CDI requires highly coherent x-ray fields
CDI solves an inverse problem to recover the complex amplitude of the x-ray field leaving the sample.
The recovered field is interpreted to gain structural information.
We will discuss
ptychography
—a scanning CDI method—and
Bragg CDI
, which relies on reciprocal-space measurements and recovers material deformation.Slide7
Bragg CDI
Collect the 3D intensity distribution around a Bragg peak
Apply iterative “phase retrieval” magic
Recover shape and deformation information at the
nanoscale
with 10
-4
or better sensitivity
Newton et al.
DOI
: 10.1038/NMAT2607Slide8
How does beam stability affect Bragg CDI?
When the motion is fast compared to the measurement time, typically 1 sec or less, the beam motion “smears” the measured signal—it is effectively partially coherent radiation!
It is possible to accommodate
this, but it is vital that the
angular distribution be known.
Stability should be maintained
at the urad level and measured
to the 10s-of-nrad level
Whitehead et al.,
doi
:
10.1103/PhysRevLett.103.243902Slide9
Section summary
Often,
beamlines
perform spatial filtering at a secondary source formed by the optical system. These geometries allow a good degree of isolation from beam motion in the focal plane of the final optics.
Out of the final focal plane, beam pointing instabilities are a significant source of measurement error
Some techniques (CDI) invoke significant data analysis that can accommodate pointing errors, but more direct techniques (DPC) suffer.Slide10
Instrument stability
C
onsider the typical conditions for x-ray experiments
Present HXN measurements as an example of what can be achieved
Highlight limitationsSlide11
Ground Vibrations
Courtesy, Nick Simos
Nanoprobe
Site, 2009
~15 nm
~50 nmSlide12
Vibrations at the MLL Microscope
~1.6 nm
@ 165 Hz
Vertical MLL
Horizontal MLL
Sample, Horizontal
Sample, Vertical
~0.6 nm
@175 Hz
~0.3 nm
@ 250 Hz
~ 0.25 nm @ 295 Hz
Courtesy Yong ChuSlide13
HXN Optical Layout
X-ray
Source
0 m
FE
XBPM
16 m
Mono
XBPM
H. Coll.
mirror
H.
Foc
.
mirror
H.
mono
X-ray
Camera
V
.
Foc
.
CRLs
98 m
67 m
28.4 m
30.4 m
34.1 m
32.6 m
Secondary
Source
Vertical direction
Horizontal direction
H.
demag
= 2.3
V.
demag
= 1.9
FXBPM: sensitive to source angle and source position
MXBPM: highly sensitive source angle
XCAM: sensitive to source angle and position
Courtesy Yong ChuSlide14
Active Feedback for Beam Positioning
No Feedback
1 Hz
5 Hz
10 Hz
25 Hz
50 Hz
100 Hz
200 Hz
Horizontal Direction
Courtesy Yong ChuSlide15
No Feedback
1 Hz
5 Hz
10 Hz
25 Hz
50 Hz
100 Hz
200 Hz
Vertical
Direction
Active Feedback for Beam Positioning
Courtesy Yong ChuSlide16
Current status of HXN
Summarize current best results from HXN beam stabilization efforts
Present before and after measurementsSlide17
X-ray Angular Stability
with active feedback at 100 Hz
Vertical: 6
nrad
RMS
Horizontal: 17
nrad
RMS
Courtesy Yong ChuSlide18
W
XRF image
Ptycho
: amplitude
Ptycho
: phase
Without Active Feedback
DPC
12
keV
: w/ MLLs
Courtesy Yong ChuSlide19
With Active Feedback @ 100 Hz
XRF image
Ptycho
: amplitude
Ptycho
: phase
DPC
12
keV
: w/ MLLs
Courtesy Yong ChuSlide20
Are these solutions universal?
Beamline
-
local feedback
Optical components need to be specially designed and modeled.
The mechanical systems tend to have resonant frequencies lower than a few hundred Hz.
The feedback is typically achieved with a double-crystal
monochromator
, but not all
beamlines have them and feedback with a device designed to take the white beam may be challenging.Sensors can be problematic. In the case of BCDI, the commonly-used segmented diamond screens will adversely affect the data quality.Slide21
Talking-point requirements
Typically,
beamlines
are relatively long, with the final optics sitting more than 50 m from the source. This likely drives the reduction of pointing variation over positional variation.
1
microradian
FWHM might be regarded as a strong upper limit on pointing stability.
State-of-the art experiments will strongly benefit from 100
nanoradian
or better stability (or tracking).Beamline-local feedbacks can help, but will begin to fail to correct motion above 100 Hz. These feedback loops can also be difficult to control for the wide range of beam conditions that an experiment may require.
Experiments are already conducted with dwell times below 10 ms
and this will decrease to below 1 ms.Slide22
Supporting: Simple calculation for dependence of diffraction/deformation sensitivity from Bragg’s law