PPT-Post-silicon Timing Diagnosis Made Simple using Formal Tech

Daher Kaiss Jonathan Kalechstain Formal Engines and Technologies Team Core CAD Technologies Intel Corp Haifa Agenda Motivation Speed path debug at Intel Introducing our tool NGSPA. Localisation. using. MAX-SAT & Backbones. Georg Weissenbacher. Charlie . Shucheng. Zhu, . Sharad. . Malik. Princeton University. (Photo: Intel Press Kit). Where did things go wrong?. Intel Pentium FDIV Bug 1994. Mike McCall, Akamai Technologies. State . of the Art . of Web . Page . Performance Measurement. Synthetic Tests. WebPageTest. , . Jmeter. Keynote, Gomez, . Pingdom. Etc.. Real User Measurement. Boomerang, Episodes. After procuring raw sand and separating the silicon, the excess material is disposed of and the silicon is purified in multiple steps to finally reach semiconductor manufacturing quality which is called electronic grade silicon. The resulting purity is so great that electronic grade silicon may only have one alien atom for every one billion silicon atoms. After the purification process, the silicon enters the melting phase. In this picture you can see how one big crystal is grown from the purified silicon melt. The resulting mono-crystal is called an ingot.. ECE . 7502 Class Discussion . B. en Calhoun. Thursday January 22, 2015. Requirements. Specification. Architecture. Logic / Circuits. Physical Design. Fabrication. Manufacturing Test. Packaging Test. PCB Test. Localisation. using. MAX-SAT & Backbones. Georg Weissenbacher. Charlie . Shucheng. Zhu, . Sharad. . Malik. Princeton University. (Photo: Intel Press Kit). Where did things go wrong?. Intel Pentium FDIV Bug 1994. Reviewer: . Shuo-Ren. , Lin. 2012/5/11. ALCom. 1. Abstract. Post-silicon functional validation challenges. Light overhead associated with the testing procedures. High-quality validation. Post-silicon functional exerciser. Kun Young Chung. *. , Andrew B. Kahng. +. and . Jiajia Li. +. + . University of California at San Diego. * . Qualcomm Inc.. Agenda. Motivation. Related Works. Our Methodology. Experimental Results. Conclusions. Wei-Ting J. Chan, Kun Young Chung, Andrew B. Kahng, Nancy D. MacDonald and . Siddhartha Nath. Outline. Motivation. Previous Work . Our Work. Multiphysics Analysis. Modeling Methodology. Results . Conclusions. Silicon Pixel Tracker – Chris Damerell. 1. The Silicon Pixel Tracker – beginning of a revolution?. Chris Damerell (RAL). SPT concept was first presented by Konstantin Stefanov in March 2008. He was made redundant by STFC shortly afterwards, but internationally, interest in the SPT has grown steadily, not only for the linear collider.. Doowon Lee. *, Tom Kolan. †. , Arkadiy Morgenshtein. †. ,. Vitali Sokhin. †. , Ronny Morad. †. , Avi Ziv. †. , Valeria Bertacco*. * University of Michigan, . †. IBM Research − Haifa. example of processor die. Silicon wafer. www.guardian.co.uk. http://. mrsec.wisc.edu. en.wikipedia.org. Wafers are cut from . boules. , . which are large . logs . of uniform . silicon.. Looking at this picture, . where. do you think silicon . Silicon wafer. www.guardian.co.uk. http://. mrsec.wisc.edu. en.wikipedia.org. Wafers are cut from . boules. , . which are large . logs . of uniform . silicon.. Looking at this picture, . where. do you think silicon . The author explores the main features of Windows XP from managing files, exploring folders, through to the control panel, printers and home networking. It is therefore an ideal introductory guide for those new to the Windows environment and enables readers to gain confidence when using the system. Tailored for non-US users Requires no technical or in-depth computer knowledgeFrequent screen shots enable readers to understand Windows XP and make use of its full capabilities Williams School of Business. Bishop’s University. Dr. Kyung Young Lee. 1. Brief Intro about me. Dr. Kyung Young Lee. Assistant Prof. in Bishop’s University, . Sherbrooke. , Quebec since Fall 2011 .