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Reinier A van Mourik MSc PhD Researcher Spintronics Devices IBM Eindhoven University of Technology IBM Almaden Research Center 650 Harry Rd San Jose CA 95120 USA Tel 1 408 927 2501 ID: 240444

devices clocking domain device clocking devices device domain wall error state input rate nml ibm read output logic alternative

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Presentation Transcript

Slide1

Contact

Reinier A. van Mourik, MSc

PhD Researcher

Spintronics

Devices

IBM / Eindhoven University of Technology

IBM

Almaden

Research Center

650 Harry Rd

San Jose, CA 95120

USA

Tel +1 408 927 2501

Fax +1 408 927 2510

Mobile +1 408 821 4559

rvmourik@us.ibm.comSlide2

Reliability of Signal Propagation in Magnetostatically

Coupled Arrays of Magnetic

Nanoelements

Reinier van Mourik1,2, Li Gao1, Brian Hughes1, Charles Rettner1, Bert Koopmans2, Stuart Parkin1

1. IBM

Almaden

Research Center, San Jose, CA

2. Eindhoven University of Technology, Eindhoven, the NetherlandsSlide3

1. Introduction

Nanomagnetic

logic - principle

Energy-efficientNon-volatileFastRadiation resistantMajority gate

A

B

D

C

M

A

B

C

D

M

Majority gate is programmable NAND/NOR gate

 Full logic set

output readSlide4

1. Introduction

Outline

Experiment and simulation:

inherent unreliabilityAlternative for conventional NML: Domain wall clockingSlide5

2. Error rate in NML devices

Experiment setup

fabrication

measurementArtificial input biases first dot according to reset direction

~70Oe

d514

MFM shows state of each dot

The RH curve of the MTJ shows output of deviceSlide6

2. Error rate in NML devices

Single device: shot-to-shot results

Output MTJ state alternates accordingly when alternating input direction.

input

outputSlide7

2. Error rate in NML devices

Many devices: device-to-device results

Success/error is highly reproducible, thus inherent in device.

68/158 (43%) of devices contain errors

repeat clocking cycle, input +x

clocking cycle, input +x

clocking cycle, input -x

1

16/123 (94

%) of devices evolve to exact same state

66/79

(

84%) of devices evolve to exact inverse state Slide8

2. Error rate in NML devices

Error rate in signal propagation - simulations

Device-to-device error rate tends to 50% as length increases

Last NM evolves before signal reaches itErrors are caused by last magnet evolving early.Slide9

3. Domain wall clocking

Domain wall clocking - principle

Fringing field from domain wall in perpendicularly magnetized material can reset

nanomagnets.Slide10

3. Domain wall clocking

DW clocking – experimental setup

PMA nanowire 60-180nm

wide Domain wall injection line

Hall bar

nanodots

Py

60x90x20nm

AMR read

hall bar read

 

 

DW

 

1. inject

DW

2. propagate

DW by H field

3. read

resistance change in AMR and Hall barSlide11

3. Domain wall clocking

DW clocking

- results

Prepare device in incorrect statePass DW underneath

End in correct state

DW clocking demonstrated in 1- and 2-magnet devicesSlide12

Conclusion

Nanomagnetic

Logic is magnetic alternative to CMOS logic

Analysis done of reliability of NML devices with integrated outputErrors are reproducible per device and tend to 50% among devices.Domain Wall clocking is demonstrated as alternative clocking scheme

slides & contact

:

http://

tinyurl.com/RvM-IBM