6K - views

Adopting Multi-Valued Logic for Reduced

Pin-Count Testing. Baohu Li, Bei Zhang and Vishwani Agrawal. Auburn University, ECE Dept., Auburn, AL 36849, USA. 16th . IEEE Latin-American Test . Symposium. Puerto Vallarta. , Mexico, March 25-27, 2015.

Embed :
Presentation Download Link

Download Presentation - The PPT/PDF document "Adopting Multi-Valued Logic for Reduced" is the property of its rightful owner. Permission is granted to download and print the materials on this web site for personal, non-commercial use only, and to display it on your personal computer provided you do not modify the materials and that you retain all copyright notices contained in the materials. By downloading content from our website, you accept the terms of this agreement.

Adopting Multi-Valued Logic for Reduced






Presentation on theme: "Adopting Multi-Valued Logic for Reduced"— Presentation transcript: