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Adopting Multi-Valued Logic for Reduced

Pin-Count Testing. Baohu Li, Bei Zhang and Vishwani Agrawal. Auburn University, ECE Dept., Auburn, AL 36849, USA. 16th . IEEE Latin-American Test . Symposium. Puerto Vallarta. , Mexico, March 25-27, 2015.

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Adopting Multi-Valued Logic for Reduced

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