PPT-Gas jet diagnostics for hollow electron lens

Carsten Welsch amp Hao Zhang for the BGC Collaboration 9 th HLLHC Collaboration meeting Fermilab USA 15 th October 2019 2 Project overview Principle of the supersonic gas jet beam profile monitor in beam induced fluorescence . Basic Introduction. Bob Ashley. 6-14-2013. Overview . Why electrons?. Wavelength and visible light. Effects of diffraction and resolution. Lens design. Defects and distortions. Magnification. Electron Duality. Bob Ashley 6-. 21. -2013. Overview. Systems of the TEM. Illumination. Condenser lens system. Specimen manipulation stage. Imaging system. Image formation. Magnification. Recording system. Reading List. Jim Atherton. Development of Light Microscope. 1590 Hans Zacharias Janssen. 1660 Robert Hook. Onserved. . cells (cork). 1. Klein, Aaron E. The Electron Microscope: A Tool of Discovery. New . Y. ork,McGRaw. Fire Protection Laboratory Methods Day. June 25, 2014. Paul M. Anderson. Graduate Research Assistant. University of Maryland. Department of Fire Protection Engineering. Transmission Electron Microscopy. Fire Protection Laboratory Methods Day. June 25, 2014. Paul M. Anderson. Graduate Research Assistant. University of Maryland. Department of Fire Protection Engineering. Transmission Electron Microscopy. Wolfram Fischer. . 28 July 2010. Fermilab Accelerator Advisory Committee Meeting. Content. Head-on beam-beam compensation . for RHIC / LHC. RHIC luminosity goals and electron lenses. LHC beam-beam compensation. Bob Ashley. 6-14-2013. Overview . Why electrons?. Wavelength and visible light. Effects of diffraction and resolution. Lens design. Defects and distortions. Magnification. Electron Duality. Electrons have a particle and wave nature. Peter Harris. Transmission . electron . microscopy. ► What . is transmission electron microscopy?. . ► TEM in biological science . ► CfAM’s TEMs. ► TEM in physical . science . ► Recent developments in TEM. Figure 1:Field emitter gun; the electron source in field emission scanning electron microscope. The only electron source designed for highresolution imaging and suitable for various kinds of materials The aims of this course are:. ● . to introduce the principles of scanning electron microscopy. ● . to describe the components of the microscope and explain how they work. ● . to highlight some of the problems which can arise during imaging. Part I:. The microscope. Sample preparation. Imaging/Contrast. Part II:. Diffraction. Defects. Part III. Spectroscopy. . MENA 3100: . TEM. Electron . gun. Condenser. . aperture. Sample holder. Objective. A. . Barnyakov. , A. . Levichev. , D. . Nikiforov. , M. . Maltseva. BINP. A.E.Levichev@inp.nsk.su. Critical current for the given voltage:. Pipe radius . a. =40 mm. Outer beam radius . r. 2. =1.8 mm. Lecture 1. The Microscope . by. Assistant Lecture. Zahraa. Mahmoud Hussain. The Microscope. It is a scientific equipment . that . magnifies . very small . objects that is not visible to the naked eye to an extent where it can be seen clearly.. The Eyelid. The eyelid protects the front part of the eye. . The lid helps keep the eye clean and moist by opening and shutting several times a minute. . Blinking. - both a voluntary and involuntary action, meaning you can blink whenever you want to, but it also happens without you even thinking about it..