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Fault Detection by Surface Scanning Tunneling Fault Detection by Surface Scanning Tunneling

Fault Detection by Surface Scanning Tunneling - PowerPoint Presentation

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Fault Detection by Surface Scanning Tunneling - PPT Presentation

Macroscope Field Test Sherif M Hanafy 27 October 2014 Outline Problem Theory Introduction to SSTM Numerical Tests Elastic synthetic examples Field example Conclusions Future Work Outline ID: 512342

migration sstm field profiles sstm migration profiles field theory problem synthetic location stacked tests future conclusions examples work pre

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Slide1

Fault Detection by Surface Scanning Tunneling Macroscope: Field Test

Sherif M. Hanafy27 October 2014Slide2

OutlineProblemTheory: Introduction to SSTM

Numerical TestsElastic synthetic examplesField exampleConclusionsFuture WorkSlide3

OutlineProblem

Theory: Introduction to SSTMNumerical TestsElastic synthetic examplesField exampleConclusionsFuture WorkSlide4

Problem

Problem: Detection of the presence of

near-surface impedance anomalies and faults

Solution:

Seismic scanning tunneling

macroscope

(SSTM) methodSlide5

Outline

ProblemTheory: Introduction to SSTMNumerical TestsElastic synthetic examplesField exampleConclusionsFuture WorkSlide6

Prestack

Migration:

 

Migration image

m(

x,s

)

Prestack

Migration

x

e

V

s

direct

scattered

s

Migration profiles

B

Mig

. Kernel

DataSlide7

Prestack

Migration:

 

Prestack

Migration

x

e

V

1. Eliminate green image

and keep profiles

direct

scattered

s

BSlide8

Prestack

Migration

x

e

V

1. Eliminate green image

and keep profiles

2. Lower recording plane

to just above

scatterer

3. Only keep profile on

recording

plane

s

e

B

direct

scattered

s

B

Prestack

Migration

:

 Slide9

Prestack

Migration:

 

Prestack

Migration

x

e

V

direct

scattered

s

B

1. Eliminate green image

and keep profiles

2. Lower recording plane

to just above

scatterer

3. Only keep profile

on

recording plane

s

e

B

4. Eliminate data. Migration

profile

SSTM m(

x,

s

)

m(

x,

s) x ε B so G(g|x)G(x|s) = recorded data and no migration velocity needed

Mig

. KernelData

Data

 Slide10

Theory

Pre-stack SSTM profiles

Source Location (s)

Trial Location

Pre-stack SSTM Profiles

 

 

 

 

B

0

400 m

SSTM

Profile

 Slide11

Pre-stack SSTM Profiles

Source Location (s)

Trial Location

Theory

 

Trial Location

Stacked SSTM

ProfileSlide12

OutlineProblem

Theory: Introduction to SSTMNumerical TestsElastic synthetic examplesField exampleConclusionsFuture WorkSlide13

Numerical Tests

3-Scatterers Velocity Model

Depth to

scatterer

clusters

Cluster # 1: 0.1

λ

Cluster #

2: 0.3

λ

Cluster #

3: 0.4

λSlide14

Shot Gather Example

Halo and Mute Early-arrivals

Time (s)

X (m)

0.0

400

0.0

0.7

Common Shot Gather # 200

P

S

Halo

Mute early-arrivals

Practical problems

Zero and near offset traces

Early

arrivalsSlide15

Halo Test

Pre-stack SSTM

Stacked SSTM

Source Location (s)

Trial Location

Scatterers

are not clearly shown on the SSTM profilesSlide16

Mute Early-arrivals Test

Pre-stack SSTM

Stacked SSTM

Source Location (s)

Trial Location

Scatterers

are shown on both the pre-stacked and the stacked SSTM profilesSlide17

OutlineProblem

Theory: Introduction to SSTMNumerical TestsElastic synthetic examplesField exampleConclusionsFuture WorkSlide18

Field TestSlide19

Data CollectionSlide20

Shot Gather Sample

Shot Gather # 1

No

. of

sor

. = no. of rec. =

120

Sor

.

int

. = rec. int. =

2.5

m

Source

is a 200

lb

weight dropSlide21

0

400

Offset

(m)

0

5

0

Z

(m)

Velocity (m/s)

400

2800

Traveltime

Tomogram

a

F

b

c

d

Ground truth:

The 1995 fault ruptureSlide22

Shot Gather Sample

Shot Gather # 1Slide23

a

F

b

c

d

a

F

b

c

d

SSTM Profiles

Pre-stacked SSTM

Stacked SSTM

F

a

b

c

d

X

XSlide24

SSTM Profiles

Pre-stacked SSTM

Stacked SSTM

Band pass

t

est, 5 – 15 Hz pass, peak freq. = 35 Hz.

a

F

b

c

d

a

F

b

c

d

F

a

b

c

d

X

X

F

c

d

bSlide25

OutlineProblem

Theory: Introduction to SSTMNumerical TestsElastic synthetic examplesField exampleConclusionsFuture WorkSlide26

Conclusions

SSTM can be used to locate near-surface impedance anomalies and faults.Elastic Synthetic examples show that scatterers need to be very close to source line.

SSTM tested on a field data, where fault and colluvial wedges can be located with SSTM methodSlide27

Possible ApplicationsNear-surface fault detection

Near-surface local anomaly detectionQC for velocity tomogramsLocate near-surface bodies such as pipes, archeology, etc.Slide28

OutlineProblem

Theory: Introduction to SSTMNumerical TestsElastic synthetic examplesField exampleConclusionsFuture WorkSlide29

Future WorkSynthetic tests using more complex velocity model

Apply f-k filter to isolate scatterer effect on the shot gathersSlide30

Acknowledgements

I would like to thank The CSIM sponsors for their supportThe students of the ‘Geophysical Field Methods’ class for their help in data collectionThank You