PDF-Progress in AberrationCorrected HighResolution Transmission Electron Microscopy Using Hardware Aberration Correction Markus Lentzen Institute of Solid State Research Ernst Ruska Centre for Microscopy
The corrected instrument a Philips CM200 FEG ST has an information limit of better than 013 nm and the spherical aberration can be varied within wide limits even
Download Presentation
Download Note : "Progress in AberrationCorrected HighResolution Transmission " is the property of its rightful owner. Permission is granted to download and print materials on this website for personal, non-commercial use only, provided you retain all copyright notices. By downloading content from our website, you accept the terms of this agreement.
Presentation Transcript
Transcript not available.