PDF-Progress in AberrationCorrected HighResolution Transmission Electron Microscopy Using Hardware Aberration Correction Markus Lentzen Institute of Solid State Research Ernst Ruska Centre for Microscopy
SO
danika-pritchard
Published 2015-01-24 | 7454 Views
The corrected instrument a Philips CM200 FEG ST has an information limit of better than 013 nm and the spherical aberration can be varied within wide limits even
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