PPT-Architectural Techniques for Improving NAND Flash Memory Reliability

Thesis Oral Yixin Luo Committee Onur Mutlu Chair Phillip B Gibbons James C Hoe Erich F Haratsch Seagate Yu Cai SK Hynix Presented in partial fulfilment of the requirements for the degree of Doctor of Philosophy. Avg Access Time 2 Tokens Number of Controllers Average Access Time clock cyles brPage 16br Number of Tokens vs Avg Access Time 9 Controllers Number of Tokens Average Access Time clock cycles brPage 17br brPage 18br 0 RELIABILITY ALLOCATION Reliability Allocation deals with the setting of reliability goals for individual subsystems such that a specified reliability goal is met and the hardware and software subsystem goals are well b Flash Serial NOR Flash SLC NAND Flash Spansion Improving Lifetime with W rite - hotness A ware R etention M anagement Yixin Luo , Yu Cai , Saugata Ghose, Jongmoo Choi*, Onur Mutlu Carnegie Mellon University, * Dankook University WARM 1 Exec Experimental Analysis, Exploits, and Mitigation Techniques. HPCA Session 3A – Monday, 3:15 . pm. , Salon F. 128GB. NAND . Flash. 256GB. NAND Flash. NAND flash scaling: . shrink size. . of each . flash cell, . Done By: . Bashayer. Al- . Suroor. ID: 200800649. Outline:. Introduction to How Flash Memory Works. A sample list of USB . devices. USB . Interface. Flash Memory: Tunneling and Erasing. How simple is the flash memory. Chip-Off Forensic Analysis. of NAND Flash Memory Devices. Aya. . Fukami. , . Saugata. . Ghose. , . Yixin. . Luo, . Yu . Cai. , . Onur. . Mutlu. 1. Brief Summary of the Paper. Our Goal. : . Identify . Memory: Characterization. , Optimization, and . Recovery. Yixin Luo. yixinluo@cmu.edu. (joint work with Yu Cai, . Erich . F. Haratsch, Ken Mai, Onur Mutlu). 1. Presented in the best paper session at HPCA 2015. Characterization, Mitigation, and Recovery. Yu . Cai. , . Yixin Luo. , Saugata Ghose, . Erich F. . Haratsch. *, Ken Mai, Onur Mutlu. Carnegie Mellon University, *Seagate Technology. Executive Summary. Flash Memory Programming:. Experimental Analysis, Exploits,. and Mitigation Techniques. Yu Cai, . Saugata Ghose. , Yixin Luo,. Ken Mai, Onur Mutlu, Erich F. . Haratsch. February 6, 2017. Executive Summary. Explain the limitations of flash memory.. Define wear leveling.. Define the term IO Transaction. Define the terms synchronous bus and asynchronous interconnect.. Explain the difference between polling and interrupts. FLIN: Enabling Fairness and Enhancing Performance in Modern NVMe Solid State Drives August 7, 2019 Santa Clara, CA Saugata Ghose Carnegie Mellon University Executive Summary Modern solid-state drives (SSDs) use new storage protocols Byzantine Architecture . Objectives. Outline the background affecting the period.. Isolate elements associated with Byzantine architecture.. Identify famous Byzantine buildings.. Recognize key terms from Byzantine architecture.. Vinod Ganapathy . Material drawn from the OSTEP book. 1. What are flash chips, aka SSDs?. Flash chips are designed to store one or more bits in a single transistor. single-level cell (SLC) flash, only a single bit is stored within a transistor (i.e., 1 or 0).