PPT-Architectural Techniques for Improving NAND Flash Memory Reliability

Author : yoshiko-marsland | Published Date : 2019-02-09

Thesis Oral Yixin Luo Committee Onur Mutlu Chair Phillip B Gibbons James C Hoe Erich F Haratsch Seagate Yu Cai SK Hynix Presented in partial fulfilment of the requirements

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Architectural Techniques for Improving NAND Flash Memory Reliability: Transcript

Thesis Oral Yixin Luo Committee Onur Mutlu Chair Phillip B Gibbons James C Hoe Erich F Haratsch Seagate Yu Cai SK Hynix Presented in partial fulfilment of the requirements for the degree of Doctor of Philosophy. Next-generation storage. Frank Shu. Senior Program Manager. Storage Ecosystem Technologies. Microsoft Corporation. Key Takeaways. Understand Solid State Drive . (SSD) technologies. Adopt best practices for SSD design in Windows platforms to enhance SSD performance and reliability. OutlineECC for High Reliability bpc Embedded SystemECC Requirements DensBits’ solutionUngraceful powerdownProblem definition Common solutions and DensBits’ solution Flash Memory Summit S @ Micron.com. Flash Memory Technology Direction . Jim Cooke. Director of Applications Engineering. Memory Products Group. Micron Technology, Inc.. Agenda . Mass Storage . HDD, HHD, SSD. How Flash can Benefit Drives. Contact Information. Wesley Brown. wes@planetarydb.com. Twitter @. WesBrownSQL. Blog . http://www.sqlserverio.com. Today’s Topic Covers…. NAND Flash Structure. MLC and SLC Compared. NAND Flash Read Properties. Improving Lifetime with W rite - hotness A ware R etention M anagement Yixin Luo , Yu Cai , Saugata Ghose, Jongmoo Choi*, Onur Mutlu Carnegie Mellon University, * Dankook University WARM 1 Exec Embedded Systems . Chanik. Park, . Jaeyu. . Seo. , . Dongyoung. . Seo. , . Shinhan. Kim and . Bumsoo. Kim . Software Center, SAMSUNG Electronics, Co., Ltd. . Proceedings of the 21st International Conference on Computer . Experimental Analysis, Exploits, and Mitigation Techniques. HPCA Session 3A – Monday, 3:15 . pm. , Salon F. 128GB. NAND . Flash. 256GB. NAND Flash. NAND flash scaling: . shrink size. . of each . flash cell, . (and Security) Issues of DRAM and NAND Flash Scaling. Onur Mutlu. omutlu@gmail.com. http://users.ece.cmu.edu/~omutlu. /. HPCA Memory . R. eliability Workshop. March 13, 2016. Limits of Charge Memory. Chip-Off Forensic Analysis. of NAND Flash Memory Devices. Aya. . Fukami. , . Saugata. . Ghose. , . Yixin. . Luo, . Yu . Cai. , . Onur. . Mutlu. 1. Brief Summary of the Paper. Our Goal. : . Identify . Memory: Characterization. , Optimization, and . Recovery. Yixin Luo. yixinluo@cmu.edu. (joint work with Yu Cai, . Erich . F. Haratsch, Ken Mai, Onur Mutlu). 1. Presented in the best paper session at HPCA 2015. Lifetime with. W. rite-hotness . A. ware . R. etention . M. anagement . Yixin Luo. , Yu . Cai. , Saugata Ghose, . Jongmoo. Choi*, Onur Mutlu. Carnegie Mellon University, *. Dankook. University. WARM. Exploiting Self-Recovery and Temperature Awareness. Yixin Luo. Saugata Ghose Yu Cai Erich F. Haratsch Onur Mutlu. HeatWatch. Storage Technology Drivers - 2018. 2. Store . large amounts . Characterization, Mitigation, and Recovery. Yu . Cai. , . Yixin Luo. , Saugata Ghose, . Erich F. . Haratsch. *, Ken Mai, Onur Mutlu. Carnegie Mellon University, *Seagate Technology. Executive Summary. Jim Cooke. Director of Applications Engineering. Memory Products Group. Micron Technology, Inc.. Agenda . Mass Storage . HDD, HHD, SSD. How Flash can Benefit Drives. Hybrid, . ReadyBoost. , Robson, SSD.

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