PPT-Vulnerabilities in MLC NAND Flash Memory Programming:

Author : faustina-dinatale | Published Date : 2017-06-11

Experimental Analysis Exploits and Mitigation Techniques HPCA Session 3A Monday 315 pm Salon F 128GB NAND Flash 256GB NAND Flash NAND flash scaling shrink size

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Vulnerabilities in MLC NAND Flash Memory Programming:: Transcript

Experimental Analysis Exploits and Mitigation Techniques HPCA Session 3A Monday 315 pm Salon F 128GB NAND Flash 256GB NAND Flash NAND flash scaling shrink size of each flash cell . @ Micron.com. Flash Memory Technology Direction . Jim Cooke. Director of Applications Engineering. Memory Products Group. Micron Technology, Inc.. Agenda . Mass Storage . HDD, HHD, SSD. How Flash can Benefit Drives. Contact Information. Wesley Brown. wes@planetarydb.com. Twitter @. WesBrownSQL. Blog . http://www.sqlserverio.com. Today’s Topic Covers…. NAND Flash Structure. MLC and SLC Compared. NAND Flash Read Properties. FLASH. Yaakov (J) Stein. Types of Memory. By memory we mean any device that stores bits of information. Volatile memory. requires voltage (. and perhaps refresh. ) to maintained information. most frequently used for RAM. Improving Lifetime with W rite - hotness A ware R etention M anagement Yixin Luo , Yu Cai , Saugata Ghose, Jongmoo Choi*, Onur Mutlu Carnegie Mellon University, * Dankook University WARM 1 Exec Embedded Systems . Chanik. Park, . Jaeyu. . Seo. , . Dongyoung. . Seo. , . Shinhan. Kim and . Bumsoo. Kim . Software Center, SAMSUNG Electronics, Co., Ltd. . Proceedings of the 21st International Conference on Computer . (and Security) Issues of DRAM and NAND Flash Scaling. Onur Mutlu. omutlu@gmail.com. http://users.ece.cmu.edu/~omutlu. /. HPCA Memory . R. eliability Workshop. March 13, 2016. Limits of Charge Memory. Memory: Characterization. , Optimization, and . Recovery. Yixin Luo. yixinluo@cmu.edu. (joint work with Yu Cai, . Erich . F. Haratsch, Ken Mai, Onur Mutlu). 1. Presented in the best paper session at HPCA 2015. Lifetime with. W. rite-hotness . A. ware . R. etention . M. anagement . Yixin Luo. , Yu . Cai. , Saugata Ghose, . Jongmoo. Choi*, Onur Mutlu. Carnegie Mellon University, *. Dankook. University. WARM. Flash Memory Programming:. Experimental Analysis, Exploits,. and Mitigation Techniques. Yu Cai, . Saugata Ghose. , Yixin Luo,. Ken Mai, Onur Mutlu, Erich F. . Haratsch. February 6, 2017. Executive Summary. Flash Memory Programming:. Experimental Analysis, Exploits,. and Mitigation Techniques. Yu Cai, . Saugata Ghose. , Yixin Luo,. Ken Mai, Onur Mutlu, Erich F. . Haratsch. February 6, 2017. Executive Summary. Exploiting Self-Recovery and Temperature Awareness. Yixin Luo. Saugata Ghose Yu Cai Erich F. Haratsch Onur Mutlu. HeatWatch. Storage Technology Drivers - 2018. 2. Store . large amounts . Thesis Oral. Yixin Luo. Committee:. Onur Mutlu (Chair) . Phillip B. Gibbons. James C. Hoe. Erich F. Haratsch, Seagate. Yu Cai, SK Hynix. Presented in partial fulfilment of the requirements for the degree of Doctor of Philosophy. Characterization, Mitigation, and Recovery. Yu . Cai. , . Yixin Luo. , Saugata Ghose, . Erich F. . Haratsch. *, Ken Mai, Onur Mutlu. Carnegie Mellon University, *Seagate Technology. Executive Summary. Jim Cooke. Director of Applications Engineering. Memory Products Group. Micron Technology, Inc.. Agenda . Mass Storage . HDD, HHD, SSD. How Flash can Benefit Drives. Hybrid, . ReadyBoost. , Robson, SSD.

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