PPT-Read Disturb Errors in MLC NAND Flash Memory: Characterizat

Yu Cai Yixin Luo Saugata Ghose Erich F Haratsch Ken Mai Onur Mutlu Carnegie Mellon University Seagate Technology Daeyeon Son 20151027 Introduction. @ Micron.com. Flash Memory Technology Direction . Jim Cooke. Director of Applications Engineering. Memory Products Group. Micron Technology, Inc.. Agenda . Mass Storage . HDD, HHD, SSD. How Flash can Benefit Drives. Contact Information. Wesley Brown. wes@planetarydb.com. Twitter @. WesBrownSQL. Blog . http://www.sqlserverio.com. Today’s Topic Covers…. NAND Flash Structure. MLC and SLC Compared. NAND Flash Read Properties. MLC-Risk Assessment Challenges & Pilot Methodology. . 3 Key Elements. Forthcoming MLC 2006 Convention. MLC 2006 Requirement for Risk Assessment. Pilot Methodology to cover the MLC 2006 Requirement for Risk Assessment. in MLC NAND Flash Memory:. Characterization, Mitigation, and Recovery. Yu . Cai. , . Yixin Luo. , Saugata Ghose, . Erich F. . Haratsch. *, Ken Mai, Onur Mutlu. Carnegie Mellon University, *Seagate Technology. SIGMETRICS. ’14. Summary. Problem. : as P/E cycle increases, raw BER significantly increases beyond the fixed ECC capability. Goal. : this paper tries to extend lifetime by reducing # of bit errors in a page (to the extent which ECC can fix). of A . 45nm SLC 3D NAND Flash . CPLD. Arijit Banerjee and Sergiu Mosanu. Date: 5/15/2015. Device scaling has reached molecular dimensions. 2D Moore’s law is about to end. 3D can be an option to further device scaling. Done By: . Bashayer. Al- . Suroor. ID: 200800649. Outline:. Introduction to How Flash Memory Works. A sample list of USB . devices. USB . Interface. Flash Memory: Tunneling and Erasing. How simple is the flash memory. Memory: Characterization. , Optimization, and . Recovery. Yixin Luo. yixinluo@cmu.edu. (joint work with Yu Cai, . Erich . F. Haratsch, Ken Mai, Onur Mutlu). 1. Presented in the best paper session at HPCA 2015. VUI: Cheryl . Platz. PM: . Sharbani. Roy & Carl . Mekala. December 28, 2015 - Version 0.5. Background. Do Not Disturb . will first ship with Communications in Q1. It will first apply to the delivery of calls and messages, but will eventually apply to the delivery of any urgent or standard notification.. Lifetime with. W. rite-hotness . A. ware . R. etention . M. anagement . Yixin Luo. , Yu . Cai. , Saugata Ghose, . Jongmoo. Choi*, Onur Mutlu. Carnegie Mellon University, *. Dankook. University. WARM. Characterization, Mitigation, and Recovery. Yu . Cai. , . Yixin Luo. , Saugata Ghose, . Erich F. . Haratsch. *, Ken Mai, Onur Mutlu. Carnegie Mellon University, *Seagate Technology. Executive Summary. Exploiting Self-Recovery and Temperature Awareness. Yixin Luo. Saugata Ghose Yu Cai Erich F. Haratsch Onur Mutlu. HeatWatch. Storage Technology Drivers - 2018. 2. Store . large amounts . Thesis Oral. Yixin Luo. Committee:. Onur Mutlu (Chair) . Phillip B. Gibbons. James C. Hoe. Erich F. Haratsch, Seagate. Yu Cai, SK Hynix. Presented in partial fulfilment of the requirements for the degree of Doctor of Philosophy. Characterization, Mitigation, and Recovery. Yu . Cai. , . Yixin Luo. , Saugata Ghose, . Erich F. . Haratsch. *, Ken Mai, Onur Mutlu. Carnegie Mellon University, *Seagate Technology. Executive Summary.