PPT-Handling Resistance Drift in Phase Change Memory - Device,
Author : faustina-dinatale | Published Date : 2016-03-29
Manu Awasthi Manjunath Shevgoor Kshitij Sudan Rajeev Balasubramonian Bipin Rajendran Viji Srinivasan University of Utah IBM Research Quick Summary
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Handling Resistance Drift in Phase Change Memory - Device,: Transcript
Manu Awasthi Manjunath Shevgoor Kshitij Sudan Rajeev Balasubramonian Bipin Rajendran Viji Srinivasan University of Utah IBM Research Quick Summary. Zhimin. He. iTechs. – ISCAS. 2013-03-21. Agenda. What’s Concept Drift. Causes of a Concept Drift. Types of Concept Drift. Detecting and Handling Concept Drift. Implications for Software Engineering Research. for Building and Sustaining a Culture of Safety. Mark W. Lipe. Education and Training Specialist. U.S. Department of Labor. Mine Safety & Health Administration. Educational Field Services (EFS). Overview. I/O is:. Varied. Complex. Error prone. A bad place for the typical user to be wandering around. The operating system really needs to make I/O a lot friendlier. Important Elements of I/O Architecture. for Building and Sustaining a Culture of Safety. Mark W. Lipe. Education and Training Specialist. U.S. Department of Labor. Mine Safety & Health Administration. Educational Field Services (EFS). Overview. for Building and Sustaining a Culture of Safety. Mark W. Lipe. Education and Training Specialist. U.S. Department of Labor. Mine Safety & Health Administration. Educational Field Services (EFS). Overview. 1. 2. old balance. new balance. change. imbalance. There is no change without resistance!. or:. „Nobody likes change – except a wet baby. “. !. Challenging new change process. shock. denial. comprehension cognitive. Lecture . 14. Direct Memory Access. Networked Embedded Systems. Sachin. . Katti. & . Pengyu. . Zhang. Why do we need DMA. ?. Why do we need DMA. ?. Polling and Interrupt driven I/O concentrates on data transfer between the processor and I/O devices. . Koo. sm.koo1989@gmail.com. “NVM Duet: Unified Working Memory and Persistent Store Architecture”. Ren-. Shuo. Liu, De-Yu Shen, Chia-Lin Yang, Shun-. Chih. Yu, Cheng-Yuan Michael Wang. Index. Background. Manu Awasthi⁺. , . Manjunath. . Shevgoor. ⁺, Kshitij Sudan⁺, Rajeev Balasubramonian⁺, . Bipin. . Rajendran. ‡. , . Viji. . Srinivasan. ‡. ⁺. University of Utah, . ‡. IBM Research. Quick Summary. Mark W. Lipe. Education and Training Specialist. U.S. Department of Labor. Mine Safety & Health Administration. Educational Field Services (EFS). Overview. Discuss why many safety initiatives often fail to meet expectations. Figure 1 Cross-sectional views of left a directly and right an indirectly heated GeTe phase change switch Figure 2 SEM images of the fabricated GeTe phase change switches Left Directly heated phase ch Odd populations Deer at Seneca Army DepotCheetah Zosteropslateralis (example of sampling error)Clegg et al Founder EffectWhat happens when a small number of individuals start a new populations?Can res J. Carmona. R. Gavaldà. UPC (Barcelona, Spain). 1. Outline. The Advent of Process Mining (PM). T. he challenge of Concept Drift (CD). Key ingredients. Online strategy for CD in PM. Experiments. Work in progress. Shimin . Chen. * Phillip B. Gibbons* Suman Nath. +. *Intel Labs Pittsburgh . +. Microsoft Research. Introduction. PCM is an emerging non-volatile memory technology. Samsung is producing a PCM chip for mobile handsets.
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