PPT-EBSD Electron Backscattered Diffraction, Crystallography in the SEM: Detector Requirements

Mark Stewart Materials Characterisation Workshop on low gain fast silicon detectors for EM and synchrotron applications Nov 25th Welcome to the National Physical Laboratory Workshop on low gain fast silicon detectors for EM and synchrotron applications. The science that examines the arrangement of atoms in solids.. "crystallography" derives from the Greek words . crystallon. "cold drop, frozen drop" . W. hat is a crystal? - crystalline if the atoms or ions that compose it are arranged in a regular way. X-Ray Diffraction. I. X-Ray Diffraction. Uses X-Rays to identify the arrangement of atoms, molecules, or ions within a crystalline solid. Quantitative and qualitative . Ooi. , L. . Principles of X-ray Crystallography . SEM . E. LECTRON . B. ACK-. S. CATTERED . D. IFFRACTION. Geoffrey E. Lloyd. School of Earth & Environment, Leeds University. Acknowledgements:. . Niels-Henrik. Schmidt, Austin Day, Pat . Trimby. Physics 2415 Lecture 38. Michael Fowler, . UVa. Today’s Topics. Multi-slit interference. The diffraction grating: spectra. Waves and particles, more diffraction. Radio . astronomy. Light Intensity Pattern from Two Slits. g Basic Crystallography g Why Use Diffraction in the TEM? g Bragg’s Law g Selected Area Electron Diffraction 1 2 Crystal Structure  A crystal structure is defined as a regular arrang August. . 18. th. , . 201. 5. Carnegie Mellon University, Pittsburgh. MURI Meeting, 2015. Saransh Singh. Marc . De Graef. 2. Outline. Introduction to . Forward Models in Electron . Scattering. Electron . deposition . activities . . of . the . crystallographic . community . .  . John R . Helliwell. and Brian McMahon. This Session . Includes several major databases encompassing many fields of the . Jonathan Cowen. Swagelok . Center for the Surface Analysis of Materials. Case School of Engineering. Case Western Reserve University. . October 27, 2014. . . Outline. X-ray Diffraction (XRD). History and background. P. Thieberger, C. Chasman, W. Fischer, D. Gassner, X. Gu, M. Minty, A. Pikin . Speculations based on:. The . electron backscattering detector (eBSD), a new tool for the precise mutual alignment of the electron and ion beams in electron lenses* . Derek A. Wann. University of Edinburgh. Workshop on Ultrafast Electron Sources. UCLA. 14. th. December . 2012. . Acknowledgements. Funding:. Stuart . Young. Matthew. Robinson. Paul. Lane. Overview. Resolution of SEMTransmissionelectronmicroscopy(TEM)isamicroscopytechniquewherebyabeamofelectronsistransmittedthroughanultrathinspecimen,interactingwiththespecimenasitpassesthrough.Animageisformedfrom The aims of this course are:. ● . to introduce the principles of scanning electron microscopy. ● . to describe the components of the microscope and explain how they work. ● . to highlight some of the problems which can arise during imaging. Michael Fowler, . UVa. Today’s Topics. Multi-slit interference. The diffraction grating: spectra. Waves and particles, more diffraction. Radio astronomy. Light Intensity Pattern from Two Slits. We have two equal-strength rays, phase shifted by. EDS system. Sample Loading. STEM detector. Stage Rotation 360. o. Tilt: 70 . o. BS detector. V, kV. depth, um. A. Density g/cm3. Z . 1. 0.00818. 106.42. 11.9. 46. 2. 0.0260. 5. 0.120. 10. 0.382. 12.