PPT-EBSD Electron Backscattered Diffraction, Crystallography in the SEM: Detector Requirements
Author : genesantander | Published Date : 2020-06-20
Mark Stewart Materials Characterisation Workshop on low gain fast silicon detectors for EM and synchrotron applications Nov 25th Welcome to the National Physical
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EBSD Electron Backscattered Diffraction, Crystallography in the SEM: Detector Requirements: Transcript
Mark Stewart Materials Characterisation Workshop on low gain fast silicon detectors for EM and synchrotron applications Nov 25th Welcome to the National Physical Laboratory Workshop on low gain fast silicon detectors for EM and synchrotron applications. The science that examines the arrangement of atoms in solids.. "crystallography" derives from the Greek words . crystallon. "cold drop, frozen drop" . W. hat is a crystal? - crystalline if the atoms or ions that compose it are arranged in a regular way. SEM . E. LECTRON . B. ACK-. S. CATTERED . D. IFFRACTION. Geoffrey E. Lloyd. School of Earth & Environment, Leeds University. Acknowledgements:. . Niels-Henrik. Schmidt, Austin Day, Pat . Trimby. g Basic Crystallography g Why Use Diffraction in the TEM? g Bragg’s Law g Selected Area Electron Diffraction 1 2 Crystal Structure A crystal structure is defined as a regular arrang By Cade Grigsby. 1. What can X-ray diffraction tell us?. Structure. Bonds. Length. Type. Arrangement. Geometry of crystal. Picture. Electron density map. Diffraction. Angle. Intensity. 2. From X-Rays to Structure. MTEX inside . Matlab. For 27-750. Texture, Microstructure and Anisotropy. A.D. . . Rollett. Last revised:. . 3. rd. Feb. . 2016. In-Class Questions. What is “texture”? . Texture quantifies any bias in crystal orientations with respect to a reference frame associated with the specimen shape, or equivalent. This is extended to grain boundary (GB) texture or preference for one type of GB over another. GB texture can be present even when the orientation texture is random.. Martin Centurion. Department of Physics and Astronomy. University of Nebraska – Lincoln. 1. Outline. 2. Diffraction from aligned molecules:. 3D molecular images with sub-Angstrom resolution. Imaging of transient structures: Molecules in intense laser fields.. P. Thieberger, C. Chasman, W. Fischer, D. Gassner, X. Gu, M. Minty, A. Pikin . Speculations based on:. The . electron backscattering detector (eBSD), a new tool for the precise mutual alignment of the electron and ion beams in electron lenses* . Derek A. Wann. University of Edinburgh. Workshop on Ultrafast Electron Sources. UCLA. 14. th. December . 2012. . Acknowledgements. Funding:. Stuart . Young. Matthew. Robinson. Paul. Lane. Overview. Scanning Electron Microscopy (SEM). Uses. Sample Preparation. Instrument. Principles. Micrographs. Transmission Electron Microscopy (TEM). Uses. Sample Preparation. Instrument. Principles. Micrographs. A. Pikin. Outline. Goal of the depressed electron collector development. High voltage structure of the Gatling Gun test bench. Design layout of the electron collector. Electric field distribution and analysis. Dmitrii Razinkov. Kristín Vilbergsdóttir. Selma Rut Sófusdóttir. The JEOL JXA-8230 electron microprobe. Mechanism of the instrument. . Electrons emitted from the electron source are accelerated at a certain accelerating voltage and collimated through electron lenses. When this electron beam hits a specimen, X-rays are generated from the specimen. By dispersing this X-ray using a dispersive element, the composition of the specimen can be examined. This type of spectrometer is called a wavelength dispersive X-ray spectrometer (WDS). IYCr. outreach activities. Presented by Cora Lind-Kovacs. But…. Many thanks to all who have contributed ideas and events – especially the entire ACA IYCr2014 taskforce – you’re the ones making this possible!. The aims of this course are:. ● . to introduce the principles of scanning electron microscopy. ● . to describe the components of the microscope and explain how they work. ● . to highlight some of the problems which can arise during imaging. Mike Sullivan. EICUG 2019. July 22-26. Paris, France . 1. Outline. Introduction. Detector Issues. Machine Issues. Unique features of the EIC. Some general questions for the detector and accelerator teams.
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