EECT 7327 Fall 2014 DAC Architecture DAC Architecture 2 Data Converters DAC Professor Y Chiu EECT 7327 Fall 2014 Nyquist DAC architectures Binaryweighted DAC Unitelement thermometercoded DAC ID: 675248
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Slide1
– 1 –
Data Converters DAC Professor Y. ChiuEECT 7327 Fall 2014
DAC ArchitectureSlide2
DAC Architecture–
2 –Data Converters DAC Professor Y. Chiu
EECT 7327
Fall 2014
Nyquist DAC architectures
Binary-weighted DAC
Unit-element (thermometer-coded) DAC
Segmented DAC
Resistor-string, current-steering, charge-redistribution DACs
Oversampling DAC
Oversampling performed in digital domain (zero stuffing)
Digital noise shaping (
ΣΔ
modulator)
1-bit DAC can be used
Analog reconstruction/smoothing filterSlide3
– 3 –
Data Converters DAC Professor Y. ChiuEECT 7327 Fall 2014
Binary-Weighted DACSlide4
Binary-Weighted CR DAC–
4 –Data Converters DAC Professor Y. Chiu
EECT 7327
Fall 2014
Binary-weighted capacitor array
→ most efficient architecture
Bottom plate @ V
R
with b
j
= 1 and @ GND with b
j
= 0
C
u = unit capacitanceSlide5
Binary-Weighted CR DAC–
5 –Data Converters DAC Professor Y. Chiu
EECT 7327
Fall 2014
C
p
→
gain error (nonlinearity if C
p
is nonlinear)
INL and DNL limited by capacitor array mismatchSlide6
Stray-Insensitive CR DAC–
6 –Data Converters DAC Professor Y. Chiu
EECT 7327
Fall 2014
Large A needed to attenuate summing-node charge sharingSlide7
MSB Transition–
7 –Data Converters DAC Professor Y. Chiu
EECT 7327
Fall 2014
Largest DNL error occurs at the midpoint where MSB transitions, determined by the mismatch between the MSB capacitor and the rest of the array.
Code 0111
Code 1000Slide8
Midpoint DNL–
8 –Data Converters DAC Professor Y. Chiu
EECT 7327
Fall 2014
δ
C > 0 results in positive DNL
δ
C < 0 results in negative DNL or even nonmonotonicity
δ
C > 0
δ
C < 0Slide9
Output Glitches–
9 –Data Converters DAC Professor Y. Chiu
EECT 7327
Fall 2014
Glitches cause waveform distortion, spurs and elevated noise floors
High-speed DAC output is often followed by a de-glitching SHA
Cause: Signal and clock skew in circuits
Especially severe at MSB transition where all bits are switching –
0111…111
→
1000…000Slide10
De-Glitching SHA
– 10 –
Data Converters DAC Professor Y. Chiu
EECT 7327
Fall 2014
SHA output must be smooth (exponential settling can be viewed as pulse shaping
→ SHA BW does not have to be excessively large
).
SHA samples the output of the DAC after it settles and then hold it for T, removing the glitching energy.Slide11
Frequency Response–
11 –Data Converters DAC Professor Y. Chiu
EECT 7327
Fall 2014Slide12
Binary-Weighted Current DAC
– 12 –Data Converters DAC Professor Y. Chiu
EECT 7327
Fall 2014
Current switching is simple and fast
V
o
depends on R
out
of current sources without op-amp
INL and DNL depend on matching, not inherently monotonic
Large component spread (2
N-1
:1)Slide13
R-2R DAC–
13 –Data Converters DAC Professor Y. Chiu
EECT 7327
Fall 2014
A binary-weighted current DAC
Component spread greatly reduced (2:1)Slide14
– 14 –
Data Converters DAC Professor Y. ChiuEECT 7327 Fall 2014
Unit-Element DACSlide15
Resistor-String DAC–
15 –Data Converters DAC Professor Y. Chiu
EECT 7327
Fall 2014
Simple, inherently monotonic
→ good DNL performance
Complexity
↑ speed ↓ for large N, typically N ≤ 8 bitsSlide16
Code-Dependent Ro
– 16 –
Data Converters DAC Professor Y. Chiu
EECT 7327
Fall 2014
R
o
of ladder varies with signal (code)
On-resistance of switches depend on tap voltage
Signal-dependent
R
o
C
o
causes HDSlide17
DNL–
17 –Data Converters DAC Professor Y. Chiu
EECT 7327
Fall 2014Slide18
INL–
18 –Data Converters DAC Professor Y. Chiu
EECT 7327
Fall 2014Slide19
INL and DNL of BW DAC–
19 –Data Converters DAC Professor Y. Chiu
EECT 7327
Fall 2014
A BW DAC is typically constructed using unit elements, the same way as that of a UE DAC, for good component matching accuracy.Slide20
Current-Steering DAC–
20 –Data Converters DAC Professor Y. Chiu
EECT 7327
Fall 2014
Fast, inherently monotonic
→ good DNL performance
Complexity
increases for large N, requires B2T decoderSlide21
Unit Current Cell–
21 –Data Converters DAC Professor Y. Chiu
EECT 7327
Fall 2014
2
N
current cells typically decomposed into a (2
N/2
×
2
N/2)
matrix
Current source cascoded to improve accuracy (R
o
effect)Coupled inverters improve synchronization of current switchesSlide22
– 22 –
Data Converters DAC Professor Y. ChiuEECT 7327 Fall 2014
Segmented DACSlide23
BW vs. UE DACs–
23 –Data Converters DAC Professor Y. Chiu
EECT 7327
Fall 2014
Binary-weighted DAC
Pros
Min. # of switched elements
Simple and fast
Compact and efficient
Cons
Large DNL and glitches
Monotonicity not guaranteed
INL/DNL
INL(max) ≈ (√N/2)
σ
DNL(max) ≈ 2*INL
Unit-element DAC
Pros
Good DNL, small glitches
Linear glitch energy
Guaranteed monotonic
Cons
Needs B2T decoder
complex for N
≥ 8
INL/DNL
INL(max) ≈ (√N/2)
σ
DNL(max) ≈
σ
Combine BW and UE architectures → SegmentationSlide24
Segmented DAC–
24 –Data Converters DAC Professor Y. Chiu
EECT 7327
Fall 2014
MSB DAC: M-bit UE DAC
LSB DAC: L-bit BW DAC
Resolution: N = M + L
2
M
+L switching elements
Good DNL
Small glitches
Same INL as BW or UESlide25
Comparison–
25 –Data Converters DAC Professor Y. Chiu
EECT 7327
Fall 2014
Example
: N = 12, M = 8, L= 4,
σ
= 1%
Architecture
σ
INL
σ
DNL
# of s.e.
Unit-element
0.32 LSB’s
0.01 LSB’s
2
N
= 4096
Binary-weighted
0.32 LSB’s
0.64 LSB’s
N = 12
Segmented
0.32 LSB’s
0.06 LSB’s
2
M
+L = 260
Max. DNL error occurs at the transitions of MSB segmentsSlide26
Example: “8+2” Segmented Current DAC
– 26 –
Data Converters DAC Professor Y. Chiu
EECT 7327
Fall 2014
Ref: C.-H. Lin and K. Bult, “A 10-b, 500-MSample/s CMOS DAC in 0.6mm
2
,”
IEEE
Journal of Solid-State Circuits
, vol. 33, pp. 1948-1958, issue 12, 1998.Slide27
MSB-DAC Biasing Scheme–
27 –Data Converters DAC Professor Y. Chiu
EECT 7327
Fall 2014
Common-centroid global biasing + divided 4 quadrants of current cellsSlide28
MSB-DAC Biasing Scheme–
28 –Data Converters DAC Professor Y. Chiu
EECT 7327
Fall 2014Slide29
Randomization and Dummies
– 29 –Data Converters DAC Professor Y. Chiu
EECT 7327
Fall 2014Slide30
References–
30 –Data Converters DAC Professor Y. Chiu
EECT 7327
Fall 2014
M. J. M.
Pelgrom
, JSSC, pp. 1347-1352, issue 6, 1990.
D. K. Su and B. A.
Wooley
, JSSC, pp. 1224-1233, issue 12, 1993.
C.-H. Lin and K.
Bult
, JSSC, pp. 1948-1958, issue 12, 1998.
K. Khanoyan, F. Behbahani, A. A.
Abidi, VLSI, 1999, pp. 73-76.K. Falakshahi, C.-K. Yang, B. A. Wooley, JSSC, pp. 607-615, issue 5, 1999.
G. A. M. Van Der
Plas
et al., JSSC, pp. 1708-1718, issue 12, 1999.
A. R.
Bugeja
and B.-S. Song, JSSC, pp. 1719-1732, issue 12, 1999.
A. R.
Bugeja
and B.-S. Song, JSSC, pp. 1841-1852, issue 12, 2000.A. van den Bosch et al., JSSC, pp. 315-324, issue 3, 2001.