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  • Search Results for '1 Progettazione Di Circuiti E Sistemi Vlsi'

Approximation Schemes for Covering and Packing Problems in Image Processing and VLSI DORIT
Approximation Schemes for Covering and Packing Problems in Image Processing and VLSI DORIT
briana-ranney
Garant“te a’ votro p“anoforteun d“
Garant“te a’ votro p“anoforteun d“
cheryl-pisano
Basi di Dati e Sistemi Informativi IISpecifyingOperations--12003 Giorg
Basi di Dati e Sistemi Informativi IISpecifyingOperations--12003 Giorg
danika-pritchard
Natarajan Meghanathan et al. (Eds) : ICCSEA, SPPR, VLSI, WiMoA, SCAI,
Natarajan Meghanathan et al. (Eds) : ICCSEA, SPPR, VLSI, WiMoA, SCAI,
myesha-ticknor
Runtime Mechanisms for Leakage Current Reduction in CMOS VLSI Circuits Afshin Abdollahi
Runtime Mechanisms for Leakage Current Reduction in CMOS VLSI Circuits Afshin Abdollahi
tawny-fly
Yeni prosedür sistemi Yeni ekipman
Yeni prosedür sistemi Yeni ekipman
phoebe-click
Fourteen Ways to Fool Your Synchronizer Ran Ginosar VLSI Systems Research Center TechnionIsrael
Fourteen Ways to Fool Your Synchronizer Ran Ginosar VLSI Systems Research Center TechnionIsrael
alexa-scheidler
Leakage Current Reduction in CMOS VLSI Circuits by Input Vector Control Afshin Abdollahi
Leakage Current Reduction in CMOS VLSI Circuits by Input Vector Control Afshin Abdollahi
calandra-battersby
Sistemi integrati per CRRT: gestione e monitoraggio del tra
Sistemi integrati per CRRT: gestione e monitoraggio del tra
lindy-dunigan
Economia dei Sistemi Industriali
Economia dei Sistemi Industriali
tatiana-dople
Nanometer InP Electron Devices for VLSI and THz Application
Nanometer InP Electron Devices for VLSI and THz Application
tawny-fly
F 2002EECS 579: Digital Testing1Some real defects in VLSI and PCBStuck
F 2002EECS 579: Digital Testing1Some real defects in VLSI and PCBStuck
lindy-dunigan
EE 194: Advanced VLSI
EE 194: Advanced VLSI
faustina-dinatale
VLSI Design Embedded Systems Conference Tutorial Program Day Jan rd Session T Session
VLSI Design Embedded Systems Conference Tutorial Program Day Jan rd Session T Session
conchita-marotz
Diffusion Break-Aware Leakage Power Optimization and Detailed Placement in Sub-10nm VLSI
Diffusion Break-Aware Leakage Power Optimization and Detailed Placement in Sub-10nm VLSI
cheryl-pisano
Externally Tested
Externally Tested
liane-varnes
Digital Circuits to Compensate for
Digital Circuits to Compensate for
cheryl-pisano
247207
247207
myesha-ticknor
III-V MOS: Planar and Fin Technologies
III-V MOS: Planar and Fin Technologies
faustina-dinatale
Keynote:
Keynote:
tawny-fly
Praveen Venkataramani
Praveen Venkataramani
debby-jeon
VLSI CAD Overview:
VLSI CAD Overview:
aaron
W. Rhett DavisNC State UniversityECE 546Fall 2012ECE 546 -VLSI Systems Designwith significant
W. Rhett DavisNC State UniversityECE 546Fall 2012ECE 546 -VLSI Systems Designwith significant
lois-ondreau
EE 414 – Introduction to VLSI Design
EE 414 – Introduction to VLSI Design
tawny-fly