PPT-Effects of Variation on Emerging Devices for Use in SRAM

Greg LaCaille and Lucas Calderin SRAM Power Consumption Minimum operating supply voltage Vmin determined by Minimum acceptable Ion Ioff ratio Effects of performance variation on read and write margins . MIN. Tracking. ECE . 7502 Class . Proposal. Arijit Banerjee. 12. th. Feb 2015. Requirements. Specification. Architecture. Logic / Circuits. Physical Design. Fabrication. Manufacturing Test. Packaging Test. W. rite V. MIN. Tracking. ECE . 7502 Class . Final Presentation. Arijit Banerjee. 21. th. Apr 2015. Requirements. Specification. Architecture. Logic / Circuits. Physical Design. Fabrication. Manufacturing Test. in Online Social Networks. Farshad Kooti. *. Winter Mason. †. Krishna Gummadi. *. Meeyoung Cha. ‡. MPI-SWS. *. Stevens Institute of Technology. †. . KAIST. ‡. CIKM 2012. Prediction of Emerging Social Conventions in OSNs- Farshad Kooti. Introduction to Microprocessor Systems. Michael G. Morrow, P.E.. Week 9. Topics. Memory technologies. Organization and operation of typical SRAM, EPROM and flash memory devices. Memory subsystem design. Power Point Slides. PROPRIETARY MATERIAL. . © 2014 The McGraw-Hill Companies, Inc. All rights reserved. No part of this PowerPoint slide may be displayed, reproduced or distributed in any form or by any means, without the prior written permission of the publisher, or used beyond the limited distribution to teachers and educators permitted by McGraw-Hill for their individual course preparation. PowerPoint Slides are being provided only to authorized professors and instructors for use in preparing for classes using the affiliated textbook. No other use or distribution of this PowerPoint slide is permitted. The PowerPoint slide may not be sold and may not be distributed or be used by any student or any other third party. No part of the slide may be reproduced, displayed or distributed in any form or by any means, electronic or otherwise, without the prior written permission of McGraw Hill Education (India) Private Limited. . 2: Enough Hardware Knowledge to be Dangerous. Tom Edsall, Cisco. Outline. Gates. Combinatorial . Logic. Sequential Logic. Memories. Other Important Considerations. Rules of Thumb. Gates. Current. None. Chris Bankers. 4/29/2016. Abstract: . The effects of radiation can be permanently damaging to a device. Failure of these circuits can result in the loss of multi-million dollar products and human life. To diminish radiation effects, “. 數位電路實驗. TA: . 吳柏辰. Author: Trumen. Outline. SRAM. SDRAM. FLASH. EEPROM. SD Card. 2. SRAM. 3. 4. Features. 5. 16M-bit (2MB). . static RAMs organized as . 1024K . words. by . 16 bits. ECE 4332 Fall 2013. Team VeryLargeScaleEngineers. Robert Costanzo. Michael Recachinas. Hector Soto. Outline. Problem. Design Approach & Choices. Circuit. Block. Architecture . Novelties. Layout. Simulations & Metrics. for. . OR1200 CPU Core. Arijit . Banerjee ASIC/SOC Class 2014. Dated 05/09/2014. Motivation. 2. ASICs/SoCs have billions of transistors. Impossible to design everything manually.  . Paul Franzon. North Carolina State University. Raleigh, NC. paulf@ncsu.edu. 919.515.7351. http://www.ece.ncsu.edu/erl/faculty/paulf.html. Thanks. Thanks to Rambus for hosting this event. Spherically Gary Edge, VP for Research and Jaimie Stuart for Logistics. Lecturer: Simon Winberg Digital Systems EEE4084F Lecture 17 RC Architectures Case Studies Attribution- ShareAlike 4.0 International (CC BY-SA 4.0) Microprocessor-based: Cell Broadband Engine Architecture Analyzing Sub-threshold Bitcell Topologies and the Effects of Assist Methods on SRAM Vmin By: James Boley Benefits of Sub-threshold (V DD <V T ) Sub-threshold benefits: V DD from [1.8,1.0]V to [ eDRAM. NUCA Architecture. Javier Lira (UPC, Spain) Carlos . Molina (URV, . Spain). . javier.lira@ac.upc.edu. . carlos.molina@urv.net. . David . Brooks (Harvard, . USA) Antonio . González (Intel-UPC, .