PPT-Combating Bit Errors From Stuck Cells in Flash Memory

Using Novel Information Theory Techniques Ravi Motwani Zion Kwok Poovaiah Palangappa NVMW 2018 Outline Problem Stuck cells are bad for LDPC codes Readtime solutions are bad for QoS Solution. File . system organisation issues. Nick Gaens. Introduction. Technologies. How does it work?. Limitations. File systems: problems and workarounds. Outline. Flash . memory is a non-volatile computer storage chip that can be electrically erased and reprogrammed. Embedded Systems . Chanik. Park, . Jaeyu. . Seo. , . Dongyoung. . Seo. , . Shinhan. Kim and . Bumsoo. Kim . Software Center, SAMSUNG Electronics, Co., Ltd. . Proceedings of the 21st International Conference on Computer . in MLC NAND Flash Memory:. Characterization, Mitigation, and Recovery. Yu . Cai. , . Yixin Luo. , Saugata Ghose, . Erich F. . Haratsch. *, Ken Mai, Onur Mutlu. Carnegie Mellon University, *Seagate Technology. (and Security) Issues of DRAM and NAND Flash Scaling. Onur Mutlu. omutlu@gmail.com. http://users.ece.cmu.edu/~omutlu. /. HPCA Memory . R. eliability Workshop. March 13, 2016. Limits of Charge Memory. Done By: . Bashayer. Al- . Suroor. ID: 200800649. Outline:. Introduction to How Flash Memory Works. A sample list of USB . devices. USB . Interface. Flash Memory: Tunneling and Erasing. How simple is the flash memory. Memory: Characterization. , Optimization, and . Recovery. Yixin Luo. yixinluo@cmu.edu. (joint work with Yu Cai, . Erich . F. Haratsch, Ken Mai, Onur Mutlu). 1. Presented in the best paper session at HPCA 2015. Flash Memory Programming:. Experimental Analysis, Exploits,. and Mitigation Techniques. Yu Cai, . Saugata Ghose. , Yixin Luo,. Ken Mai, Onur Mutlu, Erich F. . Haratsch. February 6, 2017. Executive Summary. Characterization, Mitigation, and Recovery. Yu . Cai. , . Yixin Luo. , Saugata Ghose, . Erich F. . Haratsch. *, Ken Mai, Onur Mutlu. Carnegie Mellon University, *Seagate Technology. Executive Summary. Flash Memory Programming:. Experimental Analysis, Exploits,. and Mitigation Techniques. Yu Cai, . Saugata Ghose. , Yixin Luo,. Ken Mai, Onur Mutlu, Erich F. . Haratsch. February 6, 2017. Executive Summary. Explain the limitations of flash memory.. Define wear leveling.. Define the term IO Transaction. Define the terms synchronous bus and asynchronous interconnect.. Explain the difference between polling and interrupts. Thesis Oral. Yixin Luo. Committee:. Onur Mutlu (Chair) . Phillip B. Gibbons. James C. Hoe. Erich F. Haratsch, Seagate. Yu Cai, SK Hynix. Presented in partial fulfilment of the requirements for the degree of Doctor of Philosophy. Characterization, Mitigation, and Recovery. Yu . Cai. , . Yixin Luo. , Saugata Ghose, . Erich F. . Haratsch. *, Ken Mai, Onur Mutlu. Carnegie Mellon University, *Seagate Technology. Executive Summary. Read Disturb Errors in MLC NAND Flash Memory: Characterization, Mitigation, and Recovery Yu Cai , Yixin Luo , Saugata Ghose, Erich F. Haratsch *, Ken Mai, Onur Mutlu Carnegie Mellon University, *Seagate Technology Prof. Onur Mutlu. Carnegie Mellon University. Emerging Memory Technologies Lectures. These slides are . from the . Scalable . Memory Systems. course . taught at . ACACES . 2013 (July 15-19, 2013). Course Website:.